A Young modulus
measuring instrument based on a single-slit
diffraction and
buoyancy dynamic adjustment tensile method comprises a
diffraction generating device and a receiving device, the
diffraction generating device comprises a base 13, a stand column 1 vertically installed on the base 13, an upper cross beam 2 installed on the stand column 1 in a sliding mode, and a single-slit platform 7 located in the middle of the stand column 1; the
semiconductor laser 8 is fixed on the diffraction single-slit platform 7, and the digital display tension meter 9 is connected with the diffraction single-slit platform. The
light diffraction receiving device comprises a diffraction observation screen 14 and a diffraction observation screen base 16. The diffraction observation screen is placed on a
laser light path away from the single slit by one meter. A
buoyancy dynamic adjusting device is designed at the lower end of a to-be-measured wire 4 to indirectly measure the tensile force borne by the to-be-measured wire, the to-be-measured wire drives a single-slit lower knife edge to move after the length of the to-be-measured wire is expanded and contracted, the width of a single slit is changed, a 1: 10 lever 6 is connected with a single-slit upper knife edge and a
digital microscope head 5, and the upper knife edge can move up and down under the action of the 1: 10 lever 6. And the digital display
micrometer head 5 can accurately read the change of the
slit width. The device is based on a single slit diffraction principle and
buoyancy dynamic bidirectional stepless adjustment tension, and has the advantages of simple process, low manufacturing cost, small error and the like.