Probe and connector suitable for large-current high-speed signal testing

Abstract

The invention discloses a probe and a connector suitable for a large-current high-speed signal testing. The probe comprises a first contact part with a first contact part, an elastic part, a connecting part and a second contact part, the elastic part comprises a first linear part, a bent part and a second linear part; the first linear part extends in the axial direction and one end of the first linear part is connected to the other end of the first contact part and the other end connected to the second linear part through the bent part, the second linear part extends in a direction intersecting the axial direction; in an unstressed state, the central angle corresponding to the bent part is larger than 0 degree and smaller than 90 degrees; the connecting part is used for connecting the second linear part and the second contact part; the second contact part is arranged at one end part of the connecting part and is provided with at least one second contact part; according to the probe provided by the invention, a signal transmission path is shortened on the premise of providing elastic force, and the probe can be applied to high-speed signal transmission and large-current test environments.

Description

technical field [0001] The invention belongs to the technical field of signal transmission and testing, and more specifically relates to an elastic flat probe and a connector used on testing equipment suitable for high-speed signal transmission and high-current testing environments. Background technique [0002] In the manufacturing process of electronic components such as liquid crystal panels and integrated circuits, it is necessary to conduct conduction detection and operational characteristic inspection of the product. The specific detection method is to use a probe to connect the FPC contact electrode connected to the main substrate of the electronic component module or the installed These inspections are performed by connecting electrode parts such as board-to-board connectors to an inspection device. [0003] Probes commonly used at present have a pair of contacts capable of respectively contacting an electrode terminal of an electronic component and an electrode term...

AI Technical Summary

Problems solved by technology

[0004]Aiming at at least one defect or improvement requirement of the prior art, the present invention provides a probe and connector suitable for high-current high-speed signal testing, the purpose of which is to Solve the problem of severe signal attenuation caused by the long signal transmission path of the existing probe, and the problem that the signal transmission speed is limited by the excessive conduction resistance

Images