Device and method for comprehensive measurement of thermal and electrical physical properties of a two-dimensional material
A two-dimensional material, comprehensive measurement technology, applied in the direction of measurement device, material thermal development, material thermal conductivity, etc., can solve the problem of inability to measure the electrical conductivity, thermal conductivity and Seebeck coefficient of two-dimensional nanomaterials at the same time, and achieve simplification Experimental measurement process, reducing measurement error, and the effect of simple structure
Active Publication Date: 2021-06-15
TSINGHUA UNIV
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Problems solved by technology
This method can solve the problem that the electrical conductivity, thermal conductivity and Seebeck coefficient of the same two-dimensional nanomaterial cannot be measured at the same time, realize the characterization of the thermoelectric properties of the two-dimensional material, and provide reliable physical property data support for the development of new thermoelectric materials
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[0101] The thermal and electrical multi-physical property comprehensive measuring device of the two-dimensional material proposed by the present invention has the structure as follows figure 1 and figure 2 As shown, it includes a thermally conductive substrate 1, a first electrode 2, a second electrode 3, a third electrode 4, a fourth electrode 5, a first metal wire 7, a second metal wire 8 and a metal film 6; the thermally conductive substrate 1 is processed with a groove 10. The shape of the groove 10 is two symmetrical longitudinal grooves and a middle transverse groove connecting the two longitudinal grooves. The groove 10 divides the heat-conducting substrate 1 into two symmetrical regions. And the upper and lower regions in the middle, the first electrode 2, the second electrode 3, the third electrode 4 and the fourth electrode 5 are respectively arranged in the upper and lower regions of the two symmetrical regions of the heat conduction substrate 1, and the heat condu...
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The invention relates to a device and method for comprehensively measuring thermal and electrical physical properties of two-dimensional materials, and belongs to the technical field of thermoelectric performance testing of nanometer materials. The device of the present invention overlaps two ends of a rectangular two-dimensional material on two metal wires A and B, suspends the middle part to form an H-shaped structure, and uses the H-shaped structure to measure the electrical conductivity and thermal conductivity of the two-dimensional material and the Seebeck coefficient. Utilize the device of the present invention, do not need to know the laser absorptivity of two-dimensional material, can obtain simultaneously through optical and electrical comprehensive measurement method, and the accuracy of the measured two-dimensional material electrical conductivity, thermal conductivity and Seebeck coefficient are good, sensitivity high. This method does not have any requirements on the thickness and width of two-dimensional materials, and is applicable to any type of two-dimensional materials with a wide range of applications. This method can realize the characterization of thermoelectric properties of two-dimensional materials, and provide reliable physical property data support for the development of new thermoelectric materials.
Description
technical field [0001] The invention relates to a comprehensive measurement device and method for thermal and electrical physical properties of two-dimensional materials, in particular to a method for simultaneously measuring the electrical conductivity, thermal conductivity and Seebeck coefficient of two-dimensional materials by the H-shaped method, which belongs to nanomaterials Thermoelectric performance testing technology field. Background technique [0002] The rapidly growing global demand for clean energy has led to intense interest in thermoelectric materials, which can convert heat into electricity without the use of heat engines or any moving parts. However, due to the low energy conversion efficiency of thermoelectric materials, their applications are still very limited. A key parameter to measure the thermoelectric performance of thermoelectric materials is the figure of merit ZT=S of thermoelectric materials 2 Tσ / λ, where S is the Seebeck coefficient, T is the...
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IPC IPC(8): G01N25/20G01N25/18G01N27/04G06F30/20G06F119/08
CPCG01N25/18G01N25/20G01N27/041G06F30/20G06F2119/08
Inventor 张兴赵帅伊王海东
Owner TSINGHUA UNIV