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Device and method for comprehensively measuring thermal and electrical physical properties of two-dimensional material

A two-dimensional material, comprehensive measurement technology, applied in the direction of measuring device, material thermal development, material thermal conductivity, etc., can solve the problem that the electrical conductivity, thermal conductivity and Seebeck coefficient of two-dimensional nanomaterials cannot be measured at the same time

Active Publication Date: 2020-09-29
TSINGHUA UNIV
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Problems solved by technology

This method can solve the problem that the electrical conductivity, thermal conductivity and Seebeck coefficient of the same two-dimensional nanomaterial cannot be measured at the same time, realize the characterization of the thermoelectric properties of the two-dimensional material, and provide reliable physical property data support for the development of new thermoelectric materials

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  • Device and method for comprehensively measuring thermal and electrical physical properties of two-dimensional material
  • Device and method for comprehensively measuring thermal and electrical physical properties of two-dimensional material
  • Device and method for comprehensively measuring thermal and electrical physical properties of two-dimensional material

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Embodiment Construction

[0101] The thermal and electrical multi-physical property comprehensive measuring device of the two-dimensional material proposed by the present invention has the structure as follows figure 1 and figure 2 As shown, it includes a thermally conductive substrate 1, a first electrode 2, a second electrode 3, a third electrode 4, a fourth electrode 5, a first metal wire 7, a second metal wire 8 and a metal film 6; the thermally conductive substrate 1 is processed with a groove 10. The shape of the groove 10 is two symmetrical longitudinal grooves and a middle transverse groove connecting the two longitudinal grooves. The groove 10 divides the heat-conducting substrate 1 into two symmetrical regions. And the upper and lower regions in the middle, the first electrode 2, the second electrode 3, the third electrode 4 and the fourth electrode 5 are respectively arranged in the upper and lower regions of the two symmetrical regions of the heat conduction substrate 1, and the heat condu...

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Abstract

The invention relates to a device and a method for comprehensively measuring thermal and electrical physical properties of a two-dimensional material, and belongs to the technical field of nano material thermoelectric property testing. According to the device, the two ends of a rectangular two-dimensional material are overlapped on the two metal wires A and B so that the middle part is suspended to form an H-shaped structure, and the conductivity, the heat conductivity and the seebeck coefficient of the two-dimensional material are measured by utilizing the H-shaped structure. By utilizing thedevice disclosed by the invention, the laser absorptivity of the two-dimensional material does not need to be known, the laser absorptivity can be simultaneously obtained through an optical and electric comprehensive measurement method, and the measured electrical conductivity, thermal conductivity and seebeck coefficient of the two-dimensional material are good in accuracy and high in sensitivity. The method has no requirement on the thickness, width and the like of the two-dimensional material, is suitable for any type of two-dimensional material, and has a wide application range. Accordingto the method, the thermoelectric performance of the two-dimensional material can be represented, and reliable physical property data support is provided for developing a novel thermoelectric material.

Description

technical field [0001] The invention relates to a comprehensive measurement device and method for thermal and electrical physical properties of two-dimensional materials, in particular to a method for simultaneously measuring the electrical conductivity, thermal conductivity and Seebeck coefficient of two-dimensional materials by the H-shaped method, which belongs to nanomaterials Thermoelectric performance testing technology field. Background technique [0002] The rapidly growing global demand for clean energy has led to intense interest in thermoelectric materials, which can convert heat into electricity without the use of heat engines or any moving parts. However, due to the low energy conversion efficiency of thermoelectric materials, their applications are still very limited. A key parameter to measure the thermoelectric performance of thermoelectric materials is the figure of merit ZT=S of thermoelectric materials 2 Tσ / λ, where S is the Seebeck coefficient, T is the...

Claims

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Application Information

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IPC IPC(8): G01N25/20G01N25/18G01N27/04G06F30/20G06F119/08
CPCG01N25/18G01N25/20G01N27/041G06F30/20G06F2119/08
Inventor 张兴赵帅伊王海东
Owner TSINGHUA UNIV