Device and method for comprehensively measuring thermal and electrical physical properties of two-dimensional material
A two-dimensional material, comprehensive measurement technology, applied in the direction of measuring device, material thermal development, material thermal conductivity, etc., can solve the problem that the electrical conductivity, thermal conductivity and Seebeck coefficient of two-dimensional nanomaterials cannot be measured at the same time
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[0101] The thermal and electrical multi-physical property comprehensive measuring device of the two-dimensional material proposed by the present invention has the structure as follows figure 1 and figure 2 As shown, it includes a thermally conductive substrate 1, a first electrode 2, a second electrode 3, a third electrode 4, a fourth electrode 5, a first metal wire 7, a second metal wire 8 and a metal film 6; the thermally conductive substrate 1 is processed with a groove 10. The shape of the groove 10 is two symmetrical longitudinal grooves and a middle transverse groove connecting the two longitudinal grooves. The groove 10 divides the heat-conducting substrate 1 into two symmetrical regions. And the upper and lower regions in the middle, the first electrode 2, the second electrode 3, the third electrode 4 and the fourth electrode 5 are respectively arranged in the upper and lower regions of the two symmetrical regions of the heat conduction substrate 1, and the heat condu...
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