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Flicker detection multi-parameter instrument based on Lebesgue sampling and spectroscopy method

A technology of scintillation detection and scintillation detector, which is applied in the field of radiation detection, can solve the problems of high cost, difficulty of radiation detector, complicated use, etc., and achieve the effect of stable test data, clear interface and simple operation

Inactive Publication Date: 2020-10-09
NANCHANG UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, the current radiation detection devices have problems such as high cost, complicated use, and unstable measurement parameters. The existence of these problems makes it difficult for the existing radiation detectors to be widely used.

Method used

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  • Flicker detection multi-parameter instrument based on Lebesgue sampling and spectroscopy method
  • Flicker detection multi-parameter instrument based on Lebesgue sampling and spectroscopy method
  • Flicker detection multi-parameter instrument based on Lebesgue sampling and spectroscopy method

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Embodiment

[0056] Example: see Figure 1-4 .

[0057] Such as figure 1 As shown, the present invention is a scintillation detection multi-parameter instrument and spectroscopy method based on Lebesgue sampling. The scintillation detection multi-parameter instrument includes a housing 100, a power management module 200, a scintillation detector 300, a signal processing module 400, and a data acquisition Module 500, micro control module 600 and display 700; wherein:

[0058] The housing 100 includes a USB interface 110, a VGA interface 120, operation buttons 130 and a buzzer 140, which are used to protect the internal circuit, shield the external electric field and magnetic field interference, and prevent the internal circuit from generating radiation to the outside world; the USB interface 110 is connected to the mains And the power management module 200 is the charging interface of the whole system; the VGA interface 120 connects the micro-control module 600 and the display 700, and is...

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Abstract

The invention discloses a flicker detection multi-parameter instrument based on Lebesgue sampling and a spectroscopy method. The flicker detection multi-parameter instrument comprises a shell, a powermanagement module, a flicker detector, a signal processing module, a data acquisition module, a micro-control module and a display, incident radiation is emitted into the scintillation crystal and energy is consumed in the scintillation crystal to cause Ionization and excitation of scintillation atoms; the excited electrons emit visible light, the visible light is transmitted to the photomultiplier through the photoconductive device and then converted into a pulse signal, and after the obtained pulse signal is processed by the signal processing module and the data acquisition module, a detection result is transmitted to the display through the micro-control module to be displayed. The method is easy to operate, the five keys are arranged on the shell, the parameter instrument can be directly operated, the interface is clear, meanwhile, time signals of scintillation pulses are sampled based on a Lebesgue sampling method, and obtained test data are stable and reliable.

Description

technical field [0001] The invention relates to the field of radiation detection, in particular to a scintillation detection multi-parameter instrument and a spectroscopy method based on Lebesgue sampling. Background technique [0002] The current rapid development of nuclear technology has been widely used in various fields closely related to people's lives, such as station security inspection, environmental inspection, and industrial inspection. While ensuring people's safety and providing convenience for the people, it also produces radiation to the human body, causing A certain amount of damage. Therefore, the test of radiation dose has attracted more and more people's attention, and it has become particularly important to strengthen the technology of nuclear radiation detection and improve the radiation detection device. However, the current radiation detection devices have problems such as high cost, complicated use, and unstable measurement parameters. These problems...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01T1/02G01T1/202G01T1/208G01T1/36
CPCG01T1/023G01T1/202G01T1/208G01T1/362
Inventor 邓贞宙唐庆
Owner NANCHANG UNIV
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