Sample preparation method for analyzing chemical components of quartz sandstone by X-ray fluorescence spectrometry

Abstract

The invention discloses a sample preparation method for analyzing chemical components of quartz sandstone by X-ray fluorescence spectrometry, and relates to the technical field of X-ray fluorescence spectrum analysis sample preparation. Static electricity between a human body and the surface of equipment is eliminated by using an independent ground wire, and static electricity between sandstone powder is weakened by using a static electricity eliminator, so that the sandstone powder can be bonded and tableted under the condition of not adding a bonding agent, and the detection accuracy is improved; equipment conditions are reduced, so that sandstone powder can be directly tabletted and prepared by utilizing a common sample pressing machine, an edging substrate is not used, a high-pressuresample pressing machine is avoided, and the cost is reduced; the sample preparation process is simple, the consumed time is short, and the sample preparation speed is high.

Description

technical field [0001] The invention relates to the technical field of sample preparation for X-ray fluorescence spectrometry analysis, in particular to a sample preparation method for analyzing the chemical composition of quartz sandstone by X-ray fluorescence spectrometry. Background technique [0002] The secondary X-rays produced by X-rays irradiating on the material are called X-ray fluorescence. Each element will emit specific corresponding secondary X-rays, and the types of these emitted secondary X-rays (X-ray fluorescence) and Intensity can be converted into the types and contents of various elements in the sample. [0003] Samples need to be prepared when performing X-ray fluorescence spectrometry analysis. Usually, there are several methods for preparing quartz sandstone samples. 1. Melting method: the sample preparation process of the melting method is usually ① grinding; ② drying; ③ ratio with flux Mixing; ④ melting; ⑤ mold forming; ⑥ X-ray fluorescence spectro...

AI Technical Summary

Problems solved by technology

The ratio of sample to flux is usually 1:10. The melting process involves the use of precious metal utensils and platinum crucibles, and the detection takes about 4-6 hours, which is a long time; and the sample preparation process has many steps, involving weighing, high temperature, mold cleaning

The disadvantages of the fusion chip method are: high detection cost, loss of platinum utensils, long sample preparation time, high temperature risk factors, and trace elements due to dilution by adding flux, which reduces the concentration of elements in the sample to be tested, resulting in a lower detect