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An electrical card performance testing system

A testing system and performance technology, applied in environmental/reliability testing, measuring electricity, measuring devices, etc., can solve the problem of low accuracy of test results, achieve accurate and reliable collection of electrical card signals, reduce heat transfer, and reduce heat exchange effect of the process

Active Publication Date: 2022-02-18
TONGJI UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The purpose of the present invention is to provide a kind of electronic card performance test system in order to overcome the above-mentioned defects existing in the prior art, specifically a kind of variable temperature, high vacuum, high accuracy and little heat exchange direct method precision test system for electric card performance. To solve the problem of low accuracy of test results due to the heat exchange between the sample to be tested and the test environment during the performance test of the existing electric card

Method used

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Experimental program
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Embodiment 1

[0036] like figure 1 An electrical card performance test system shown includes three subsystems: a data acquisition subsystem, subsystem high voltage output, temperature vacuum heat exchange rare subsystem; wherein the data acquisition subsystem 3 by the computer, the communication line 4, a digital Meter 6, RTD to 10 are sequentially electrically connected to form, and GPIB communication line to the communication line 4, RTD to 10 selected PT100 thermal resistance and a four-wire connection 6 is connected with a digital multimeter DMM 6 realtime acquisition resistance size PT100 thermal resistance, and converted into temperature data in accordance with PT100 resistor and temperature control relationship, the computer 3 may multimeter 6 accurate temperature continuous acquisition PT100 by 4 real-time control of digital communication lines to draw temperature - time curve, PT100 to be between the test specimen 11 are bonded by thermal grease; high voltage source a high voltage outp...

Embodiment 2

[0043] like figure 1 An electrical performance test card system shown, including temperature of the test sample 11 is placed in a sealed box with the test sample 11 and the high temperature unit connected to the adjustment unit, connected to the housing and a blocking temperature through the vacuum unit;

[0044] Wherein the high pressure control unit and the sample to be tested with a thermal insulation 11 between the sample holder 9, the high pressure control unit comprises an electrode 9 are sequentially electrically connected to the sample holder 14 and the thermally insulating high-voltage source 2, a high pressure source 2 can start and stop buttons manner and testing electric field 0 of the square wave signal switching, the electrode 14 is an electrode rod.

[0045] Thermal insulation is a silver sample holder clamp 9, which clamp the two silver fine silver wires are electrically connected to high-voltage unit and adjusting the composition of silver and two thin side surfac...

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PUM

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Abstract

The invention relates to an electric card performance testing system, which includes a temperature-controlled closed box for placing a sample to be tested, a temperature measuring unit connected with the sample to be tested, a high-voltage regulating unit, and a temperature-controlled closed box connected to the Vacuum unit; among them, there is also a thermal insulation sample holder between the high voltage adjustment unit and the sample to be tested. Compared with the prior art, the present invention suspends the sample to be tested in a vacuum environment through a heat-insulated sample fixture to provide a nearly adiabatic test environment, greatly reducing the heat exchange process, and providing a sensitive and accurate data acquisition subsystem. Collecting the temperature change of the electric card sample provides an ideal environment with little heat exchange, which makes the test results more accurate. It is a low-cost, variable temperature, easy-to-operate, and stable test signal test system, which is conducive to promoting the research of electric card refrigeration materials. application process.

Description

Technical field [0001] The present invention belongs to the technical field of material testing involves a card performance test system. Background technique [0002] Conventional gas compression refrigeration method uses organic gases as refrigerants, and the release of greenhouse gas can directly cause serious damage to the ozone layer, and today's world energy problems are increasingly prominent, environmental protection is increasing, developing new economic environmental refrigeration methods to replace traditional gas compression technology Become an important research topic. Now there is a refrigeration method of development potential, there is a card refrigeration, magnetic card refrigeration, thermoelectric cooler, etc., wherein the magnetic card refrigeration and thermoelectric cooler are stupid, and the electricity refrigeration material is more efficient and flexible. The new solid-state refrigerator made by the card effect has the advantages of environmental, efficie...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N25/20G01R31/00
CPCG01N25/20G01R31/003
Inventor 沈波李国辉翟继卫
Owner TONGJI UNIV