A process for eliminating micro-short circuits in the production of functional chips by using a megohmmeter

A process method and megohmmeter technology, applied in the direction of circuit, semiconductor/solid-state device testing/measurement, electrical components, etc., can solve problems such as inability to cut with sharp blades, so as to avoid secondary defects, improve pass-through rate, and reduce scrap rate Effect

Active Publication Date: 2022-04-29
GUANGZHOU TOUCHKIT PHOTOELECTRIC TECH
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] The purpose of the invention provided by the present invention is to provide a process method for eliminating micro-short circuits in the production of functional chips by using a megohmmeter. position, and can solve the problem that the micro-short circuit with a width of silver paste line below 130um cannot be cut with a sharp blade

Method used

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  • A process for eliminating micro-short circuits in the production of functional chips by using a megohmmeter
  • A process for eliminating micro-short circuits in the production of functional chips by using a megohmmeter
  • A process for eliminating micro-short circuits in the production of functional chips by using a megohmmeter

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Embodiment Construction

[0029] The invention provides a technical scheme, such as Figure 1 As shown in, a process method for eliminating micro short circuit in the production of functional chips by using a megohmmeter comprises the following specific steps:

[0030] Step 1. Prepare fixture: multimeter, megohmmeter and HD video microscope with m European file. The model of multimeter is victorvc9807a +, the model of megohmmeter is victorvc60b +, and the model of HD video microscope is TTL HK, 15-45 times.

[0031] Step 2. After the silver paste laser etching, use a multimeter to measure and check the silver paste line micro short circuit. The multimeter is adjusted to 200m Ω for measurement. The two pointers contact two adjacent ITO channels. The multimeter shows that it is a micro short circuit if it is greater than 0.1M Ω. The ITO channel is the test channel impedance, which is greater than 0.1M Ω, and it is a micro short circuit between 0 and tens of M Ω.

[0032] Step 3: select the voltage value of th...

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Abstract

The invention provides a process method for eliminating micro-short circuits in the production of functional chips by using a megohmmeter, which relates to the technical field of eliminating micro-short circuits of functional chips, and includes the following steps: S1, preparing a jig, S2, using a multimeter to measure, S3, selecting the micro-short circuit The voltage value of the ohmmeter, S4, touch the two pointers of the megohmmeter to bind the pad, S5, eliminate the impurities of the micro-short circuit, S6, use a high-definition video microscope to observe, S7, do a functional test, S8, select the voltage of the megohmmeter , S9, eliminate short circuit failure. In the present invention, the micro-short circuit will affect the touch accuracy and linearity, and it is also an NG item in the program debugging. The micro-short circuit of the functional chip is a defective product. If it cannot be repaired, it needs to be scrapped. This process can eliminate the micro-short circuit, greatly Improve the pass-through rate of functional film production and reduce the scrap rate. Compared with the old technology, using a megohmmeter to ablate the impurities in the micro-short circuit is simple and fast, with high accuracy, and is not easy to cause secondary defects, such as cutting off the line when cutting the short-circuit position.

Description

technical field [0001] The invention relates to the technical field of eliminating the micro short circuit of functional chips, in particular to a process method for eliminating the micro short circuit in the production of functional chips by using a megger. Background technology [0002] For the micro short circuit in the production of functional films, first use the high-definition video microscope to check and confirm the position of the short circuit, and then the employees cut off the short circuit with a sharp blade under the high-definition video microscope. Due to the large line spacing and linewidth of the silver paste line, it is easy to cut. [0003] The difficulty of this process lies in finding the location of the short circuit. Because the micro short circuit is generally caused by the connection of two or more silver slurry lines by dust and sundries in the air, silver slurry sundries, fiber sundries during production, employee hair shavings and other impurities, t...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L21/48H01L21/66
CPCH01L22/24H01L22/26H01L22/22H01L22/32H01L21/4889
Inventor 丁振宇
Owner GUANGZHOU TOUCHKIT PHOTOELECTRIC TECH
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