A process for eliminating micro-short circuits in the production of functional chips by using a megohmmeter

Abstract

The invention provides a process method for eliminating micro-short circuits in the production of functional chips by using a megohmmeter, which relates to the technical field of eliminating micro-short circuits of functional chips, and includes the following steps: S1, preparing a jig, S2, using a multimeter to measure, S3, selecting the micro-short circuit The voltage value of the ohmmeter, S4, touch the two pointers of the megohmmeter to bind the pad, S5, eliminate the impurities of the micro-short circuit, S6, use a high-definition video microscope to observe, S7, do a functional test, S8, select the voltage of the megohmmeter , S9, eliminate short circuit failure. In the present invention, the micro-short circuit will affect the touch accuracy and linearity, and it is also an NG item in the program debugging. The micro-short circuit of the functional chip is a defective product. If it cannot be repaired, it needs to be scrapped. This process can eliminate the micro-short circuit, greatly Improve the pass-through rate of functional film production and reduce the scrap rate. Compared with the old technology, using a megohmmeter to ablate the impurities in the micro-short circuit is simple and fast, with high accuracy, and is not easy to cause secondary defects, such as cutting off the line when cutting the short-circuit position.

Description

technical field [0001] The invention relates to the technical field of eliminating the micro short circuit of functional chips, in particular to a process method for eliminating the micro short circuit in the production of functional chips by using a megger. Background technology [0002] For the micro short circuit in the production of functional films, first use the high-definition video microscope to check and confirm the position of the short circuit, and then the employees cut off the short circuit with a sharp blade under the high-definition video microscope. Due to the large line spacing and linewidth of the silver paste line, it is easy to cut. [0003] The difficulty of this process lies in finding the location of the short circuit. Because the micro short circuit is generally caused by the connection of two or more silver slurry lines by dust and sundries in the air, silver slurry sundries, fiber sundries during production, employee hair shavings and other impurities, t...

AI Technical Summary

Problems solved by technology

[0004] The purpose of the invention provided by the present invention is to provide a process method for eliminating micro-short circuits in the production of functional chips by using a megohmmeter. position, and can solve the problem that the micro-short circuit with a width of silver paste line below 130um cannot be cut with a sharp blade

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