Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Intelligent measurement and control system

A measurement and control system and intelligent technology, applied in the field of measurement and control, can solve the problems of difficult DA integration, isolated acquisition, and difficult integration, so as to improve sampling and output accuracy, reduce the impact of measurement accuracy, and meet the needs of measurement and control.

Pending Publication Date: 2020-12-04
SHENGLI COLLEGE CHINA UNIV OF PETROLEUM
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] Most of the existing measurement and control systems use 51 single-chip microcomputers as the core, which cannot meet the high-performance requirements of intelligent measurement and control equipment in today's "Internet +" and "big data" era
The existing measurement and control system has the following problems: high-precision (20bit and above) AD is not easy to integrate in the microprocessor, the analog sampling accuracy of the measurement and control system is not high, and the high-precision DA is not easy to integrate in the microprocessor. The analog output accuracy of the system cannot reach more than 20bit. AD acquisition experiments usually use direct coupling, which cannot meet the needs of electrical isolation. Even if linear optocoupler isolation is used, there are still some problems, such as temperature drift. The measurement accuracy is not high enough to meet During the experiment, it is required to isolate and collect slow-changing analog quantities; the communication experiment circuit is too simple, usually based on the 232 bus or 485 bus based on asynchronous communication, while the CAN bus and Ethernet communication commonly used in the industry have few corresponding experimental circuits. Unable to meet the measurement and control needs

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Intelligent measurement and control system
  • Intelligent measurement and control system
  • Intelligent measurement and control system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0036] Such as figure 1 As shown, this embodiment provides an intelligent measurement and control system, including an ARM microcontroller 10, a high-precision discrete conversion circuit 20, a low-temperature drift linear optocoupler isolation circuit 30, and a communication circuit 40, a high-precision discrete conversion circuit 20, a low-temperature drift linear The optocoupler isolation circuit 30 and the communication circuit 40 are respectively connected to the ARM microcontroller 10 .

[0037] The working principle of the intelligent measurement and control system is as follows:

[0038] During the measurement and control experiment, the analog quantity of the experimental data is accurately sampled and accurately output to the ARM microcontroller 10 through the high-precision discrete conversion circuit 20, and the received data is analyzed and processed in the next step by the ARM microcontroller 10. At the same time, The temperature drift of the signal is reduced b...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses an intelligent measurement and control system. The system comprises an ARM microcontroller, a high-precision discrete conversion circuit, a low-temperature-drift linear optocoupler isolation circuit and a communication circuit, and the high-precision discrete conversion circuit, the low-temperature-drift linear optocoupler isolation circuit and the communication circuit arerespectively connected with the ARM microcontroller. The system has the advantages that the analog quantity sampling and output precision is effectively improved, the influence of temperature drift on the measurement precision is reduced, and the measurement and control requirements are met.

Description

technical field [0001] The invention relates to the technical field of measurement and control, in particular to an intelligent measurement and control system. Background technique [0002] Most of the existing measurement and control systems use 51 single-chip microcomputers as the core, which cannot meet the high-performance requirements of intelligent measurement and control equipment in today's "Internet +" and "big data" era. The existing measurement and control system has the following problems: high-precision (20bit and above) AD is not easy to integrate in the microprocessor, the analog sampling accuracy of the measurement and control system is not high, and the high-precision DA is not easy to integrate in the microprocessor. The analog output accuracy of the system cannot reach more than 20bit. AD acquisition experiments usually use direct coupling, which cannot meet the needs of electrical isolation. Even if linear optocoupler isolation is used, there are still so...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G05B19/042
CPCG05B19/0423G05B2219/25257
Inventor 徐宁
Owner SHENGLI COLLEGE CHINA UNIV OF PETROLEUM
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products