Sample analysis system, sample analysis device, and sample analysis method
A technology of analysis device and analysis method, which is applied in material analysis using radiation diffraction, still image data retrieval, special data processing applications, etc. question
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[0024] Hereinafter, embodiments of the present disclosure will be described in detail with reference to the drawings. In addition, the same code|symbol is attached|subjected to the same or equivalent part in a figure, and the description is not repeated.
[0025]
[0026] figure 1 It is a diagram schematically showing an example of the overall configuration of the sample analysis system according to the embodiment of the present disclosure. refer to figure 1 , the sample analysis system 1 includes an X-ray diffraction device 10 and an analysis device 20 . The analysis device 20 includes a processing device 30 , a storage device 40 , an input device 70 and a display device 80 . The analysis device 20 is an information processing device for analyzing measurement data obtained from the X-ray diffractometer 10, and is constituted by, for example, a personal computer or a server.
[0027] figure 2 It is a diagram showing a configuration example of the X-ray diffractometer 1...
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