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Sample analysis system, sample analysis device, and sample analysis method

A technology of analysis device and analysis method, which is applied in material analysis using radiation diffraction, still image data retrieval, special data processing applications, etc. question

Pending Publication Date: 2020-12-25
SHIMADZU SEISAKUSHO CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0008] First, for example, in the case of using ICDD’s PDF-4+ as a database, there are more than 400,000 pieces of information on various substances registered, and there is a possibility that it may not be possible to obtain the expected information even if it is searched using the above-mentioned Hanawat method search results for
[0009] In addition, in the PDF of ICDD, groups classified by types of minerals, organic substances, and inorganic substances can be searched for, but even so, for example, the There are also more than 40,000 pieces of substance information, and there is a possibility that the expected search results may not be obtained
[0010] Second, although it is also possible to create a database of diffraction patterns by yourself after actually measuring known substances, and use this database for searching, in order to make a useful database, it is necessary to actually measure many (for example, hundreds of) known substances and It takes a lot of work to create a database of diffraction patterns for each substance
Although this method has a high probability of obtaining the expected search results, it is necessary to search for a large number (for example, hundreds of types) of identifiers of substance information and register them in the list. Register substances into the list

Method used

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  • Sample analysis system, sample analysis device, and sample analysis method
  • Sample analysis system, sample analysis device, and sample analysis method
  • Sample analysis system, sample analysis device, and sample analysis method

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Embodiment Construction

[0024] Hereinafter, embodiments of the present disclosure will be described in detail with reference to the drawings. In addition, the same code|symbol is attached|subjected to the same or equivalent part in a figure, and the description is not repeated.

[0025]

[0026] figure 1 It is a diagram schematically showing an example of the overall configuration of the sample analysis system according to the embodiment of the present disclosure. refer to figure 1 , the sample analysis system 1 includes an X-ray diffraction device 10 and an analysis device 20 . The analysis device 20 includes a processing device 30 , a storage device 40 , an input device 70 and a display device 80 . The analysis device 20 is an information processing device for analyzing measurement data obtained from the X-ray diffractometer 10, and is constituted by, for example, a personal computer or a server.

[0027] figure 2 It is a diagram showing a configuration example of the X-ray diffractometer 1...

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Abstract

The invention provides a sample analysis system, a sample analysis device, and a sample analysis method. A substance information DB (50) stores information of a plurality of substances that have beencreated in advance as a database. The associated substance name DB (60) stores the names of a plurality of associated substances included in a predetermined type (asbestos, clay minerals, and the like). A processing device (30) is configured so as to extract, from the information of the plurality of substances stored in the substance information DB (50), information of a substance having the nameof the associated substance stored in the associated substance name DB (60), and to perform qualitative analysis of the sample by comparing the measurement result of an X-ray diffraction device (10) with the extracted substance information.

Description

technical field [0001] The present disclosure relates to a sample analysis system, a sample analysis device, and a sample analysis method. Background technique [0002] Among the X-ray diffraction (XRD: X-Ray Diffraction) methods that irradiate a sample with X-rays and analyze the constituent elements of the sample by using the X-ray diffraction phenomenon, there is known a method that treats a polycrystal as a sample. Powder X-ray Diffraction. In the qualitative analysis of powder X-ray diffraction, the substance contained in the sample is identified by comparing the diffraction pattern actually measured by irradiating the sample with X-rays and the diffraction pattern of the known substance prepared in advance as a database. Identification. [0003] Specifically, in the diffraction pattern of a sample whose abscissa is the diffraction angle 2θ and the ordinate is the diffraction intensity I, Bragging (2d×sinθ=nλ, d: spacing between grating surfaces, λ: incident X The wa...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/20G06F16/51
CPCG01N23/20G06F16/51
Inventor 铃木桂次郎冈本康之
Owner SHIMADZU SEISAKUSHO CO LTD