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Wavefront sensor based on PB micro-lens array and wavefront measurement method thereof

A technology of microlens array and wavefront sensor, which is applied in the field of optical information measurement, can solve problems such as low measurement accuracy, complex structure, and difficult manufacturing, and achieve the effect of simple measurement device and high measurement resolution

Active Publication Date: 2021-01-22
SOUTH UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA
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  • Abstract
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Problems solved by technology

[0005] The technical problem to be solved by the present invention is to provide a wavefront sensor based on a PB microlens array and a wavefront measurement method for the above-mentioned defects of the prior art, aiming to solve the problem of low measurement accuracy in the existing wavefront sensing technology , complex structure, difficult manufacturing and high cost

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Embodiment Construction

[0042] In order to make the object, technical solution and advantages of the present invention more clear and definite, the present invention will be further described in detail below with reference to the accompanying drawings and examples. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0043] Those skilled in the art will understand that unless otherwise stated, the singular forms "a", "an", "said" and "the" used herein may also include plural forms. It should be further understood that the word "comprising" used in the description of the present invention refers to the presence of said features, integers, steps, operations, elements and / or components, but does not exclude the presence or addition of one or several other features, Integers, steps, operations, elements, components, and / or groups thereof. It will be understood that when an element is referred to as bein...

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Abstract

The invention provides a wavefront sensor based on a PB micro-lens array and a wavefront measurement method thereof. The wavefront sensor comprises a circularly polarized light generation module, a liquid crystal PB micro lens array module and an array type photoelectric detector module, wherein the circularly polarized light generation module is used for converting incident light into circularlypolarized light; the liquid crystal PB micro lens array module is composed of a plurality of liquid crystal PB micro lens units with the same PB phase distribution and used for focusing circularly polarized light on a focal plane; and the detector is used for receiving an image formed by focusing the circularly polarized light on the focal plane of the liquid crystal PB micro lens array module. According to the wavefront sensor, incident light is focused on a focal plane for imaging through the liquid crystal PB micro lens units, wavefront of the incident light is reconstructed according to the image, received by the detector, of the incident light focused on the focal plane, the measuring device is simple, the liquid crystal PB micro lens array module is composed of the liquid crystal PBmicro lens units of a planar structure, the measuring resolution is high, and the measuring precision is high. The manufacturing cost is low, and the integration is easy.

Description

technical field [0001] The invention relates to the technical field of optical information measurement, in particular to a wavefront sensor based on a PB microlens array and a wavefront measurement method thereof. Background technique [0002] In the fields of photoelectric detection, optical communication system, laser beam quality diagnosis, adaptive optics, etc., it is necessary to measure the wavefront of the beam. The current beam wavefront measurement methods mainly include shear interference wavefront sensing technology, curvature wavefront sensing technology and Shack-Hartmann (Shack-Hartmann) wavefront sensing technology. [0003] The shearing interference wavefront sensing technology is to divide the measured wavefront into two parts through a specific spectroscopic element, so that a certain relative displacement (shearing) occurs, and the two sheared wavefronts interfere, and the interference fringes are obtained For the phase and intensity information of the wa...

Claims

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Application Information

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IPC IPC(8): G01J9/00G01J1/42G01J1/04
CPCG01J9/00G01J1/4257G01J1/0411G01J1/0429G01J2009/002
Inventor 员海朱佑阳江淼韦齐和
Owner SOUTH UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA
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