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Ionization testing method for SF6 gas irradiated by high-energy rays

A technology of high-energy rays and testing methods, applied in measuring devices, material analysis through electromagnetic means, instruments, etc., can solve problems affecting the safe operation of GIS and achieve high sensitivity effects

Pending Publication Date: 2021-02-05
四川赛康智能科技股份有限公司
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  • Claims
  • Application Information

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Problems solved by technology

However, under high-energy X-ray irradiation, SF 6 What changes will be produced by the gas is rarely involved in the research at this stage, and many variables brought about by changes in ray intensity will have an adverse effect on the overall operation of the equipment, including SF 6 Gas insulation, this factor will directly affect the safe operation of GIS

Method used

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  • Ionization testing method for SF6 gas irradiated by high-energy rays
  • Ionization testing method for SF6 gas irradiated by high-energy rays
  • Ionization testing method for SF6 gas irradiated by high-energy rays

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Embodiment 1

[0050] This embodiment discloses high energy ray irradiation SF 6 The gas ionization test method specifically belongs to a device and method for real-time measurement of the number of free electrons produced by SF6 gas under high-energy X-ray irradiation.

[0051] Such as figure 1 As shown, it is mainly used to measure the number of free electrons produced by SF6 under the irradiation of high-energy X-rays, so as to evaluate the safety of high-energy X-rays for visual detection of GIS.

[0052] The detection is carried out in a closed container, and two electrodes are arranged in the container, and there is a gap between the two electrodes. A detection circuit is arranged outside, and the detection circuit connects two electrodes, so that the two electrodes are electrified and form a magnetic field. The container is filled with SF 6 Gas, an X-ray machine 2 is installed outside to continuously irradiate the container.

[0053] It should be noted that the high-purity SF 6 I...

Embodiment 2

[0056] In this embodiment, a test SF is also disclosed 6 The ionization analysis method of gas under high-energy ray irradiation, it needs to be determined that this method is used to guide the filling of SF in existing GIS equipment 6 During the non-destructive testing process, the possible changes of the gas are adjusted to avoid unstable operation.

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Abstract

The invention belongs to the technical field of electrical equipment detection, and discloses an ionization testing method for SF6 gas irradiated by high-energy rays, which comprises the following steps of: arranging two electrode materials at an interval in a closed space filled with SF6 gas, electrifying the two electrode materials to generate polarity, and when high-energy ray irradiation is carried out on the closed space, obtaining ionization data by obtaining a current value generated between the detection electrode materials and analyzing the current value. The quantity of free electrons produced by the SF6 gas under high-energy X-ray irradiation is accurately measured, high voltage does not need to be applied, and the safety is high; and the free electrons are accumulated to a metal electrode plate under the action of electric field force, so that current is generated, an ampere meter can accurately capture the current generated in the process, and the measurement accuracy is greatly improved.

Description

technical field [0001] The invention belongs to the technical field of electrical equipment detection, and in particular relates to an ionization test method for irradiating SF6 gas with high-energy rays. Background technique [0002] X-ray visual detection has become an effective method for GIS equipment detection at low voltage levels, but with the increase of GIS voltage level, the energy requirements of X-rays are also higher. However, under high-energy X-ray irradiation, SF 6 What changes will be produced by the gas is rarely involved in the research at this stage, and many variables brought about by changes in ray intensity will have an adverse effect on the overall operation of the equipment, including SF 6 Gas insulation, this factor will directly affect the safe operation of GIS. [0003] SF 6 It is a strong electronegative gas. Its molecules are very easy to absorb free electrons to form large-mass negative ions, which weakens the impact ionization process in th...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N27/66
CPCG01N27/66
Inventor 曾德华周维超陈甄锐万志炜
Owner 四川赛康智能科技股份有限公司
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