Aging screening test system and method for laser diode array

Abstract

The invention provides an aging screening test system and method for a laser diode array, and the system comprises a laser diode array drive module, a temperature control module, an aging module, a screening test module, and a computer control collection module which is used for controlling the working conditions of the laser diode array and collecting and recording the test result of the screening test module. The screening test module comprises an electro-optical characteristic test module, a spectrum test module, a far-field test module, a near-field test module and a microscopic examination module. The method comprises near-field luminous point test and microscopic examination test functions as well as test screening after aging of the laser diode array, full-parameter screening test of the laser diode array is realized, and through aging test, film microscopic examination of electro-optic characteristics, spectra, far-field luminous points, near-field luminous points and luminoussurfaces of the laser diode array before and after aging is carried out, the defects of the laser diode array can be found as soon as possible, the early failure problem of the laser diode array is eliminated, and the stability of the laser diode array in the satellite-borne field is improved.

Description

technical field [0001] The invention relates to the technical field of semiconductor lasers, in particular to an aging screening test system and method for a laser diode array. Background technique [0002] Due to its advantages of high power, small size and high conversion efficiency, laser diode array has gradually replaced the flash lamp pump source in solid-state lasers and has become a widely used pump source in all-solid-state lasers. The all-solid-state lasers used in the spaceborne field have high requirements for stability, so there are also strict requirements for the stability of the laser diode array, and aging screening of the selected laser diode array is required. [0003] The stability of the laser diode array directly affects the stability of the all-solid-state laser, especially the laser diode array used in the spaceborne field. The test system of the laser diode array in the prior art can realize the test of the electro-optic characteristic, the spectral...

AI Technical Summary

Problems solved by technology

[0005] The present invention aims to solve the screening problem of laser diode arrays used in the space-borne field, and provides an aging screening test system and method for laser diode arrays, including near-field light-emitting point testing, far-field divergence angle testing, electro-optic characteristic testing, and spectral testing. , Mirror inspection test function and test screening of laser diode array after aging, realize the full parameter screening test of laser diode array, and through the aging test, the electro-optic characteristics, spectrum, far-field, near-field luminous point of the laser diode array before and after aging And the microscopic inspection of the film layer on the light-emitting surface can detect the defects of the laser diode array as early as possible, eliminate the early failure of the laser diode array, and improve the stability of the laser diode array in the spaceborne field

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