Aging screening test system and method for laser diode array

A laser diode and aging screening technology, applied in the direction of optical testing flaws/defects, testing optical performance, environment/reliability testing, etc., to achieve the effect of eliminating early failure and high integration
CN112433125AActive Publication Date: 2021-03-02BEIJING RES INST OF TELEMETRY +1
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
BEIJING RES INST OF TELEMETRY
Publication Date
2021-03-02

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Abstract

The invention provides an aging screening test system and method for a laser diode array, and the system comprises a laser diode array drive module, a temperature control module, an aging module, a screening test module, and a computer control collection module which is used for controlling the working conditions of the laser diode array and collecting and recording the test result of the screening test module. The screening test module comprises an electro-optical characteristic test module, a spectrum test module, a far-field test module, a near-field test module and a microscopic examination module. The method comprises near-field luminous point test and microscopic examination test functions as well as test screening after aging of the laser diode array, full-parameter screening test of the laser diode array is realized, and through aging test, film microscopic examination of electro-optic characteristics, spectra, far-field luminous points, near-field luminous points and luminoussurfaces of the laser diode array before and after aging is carried out, the defects of the laser diode array can be found as soon as possible, the early failure problem of the laser diode array is eliminated, and the stability of the laser diode array in the satellite-borne field is improved.
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Description

technical field

[0001] The invention relates to the technical field of semiconductor lasers, in particular to an aging screening test system and method for a laser diode array. Background technique

[0002] Due to its advantages of high power, small size and high conversion efficiency, laser diode array has gradually replaced the flash lamp pump source in solid-state lasers and has become a widely used pump source in all-solid-state lasers. The all-solid-state lasers used in the spaceborne field have high requirements for stability, so there are also strict requirements for the stability of the laser diode array, and aging screening of the selected laser diode array is required.

[0003] The stability of the laser diode array directly affects the stability of the all-solid-state laser, especially the laser diode array used in the spaceborne field. The test system of the laser diode array in the prior art can realize the test of the electro-optic characteristic, the spectral...

Claims

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