Homodyne one-dimensional grating displacement measurement device

A grating displacement and measuring device technology, which is applied in the direction of measuring devices, optical devices, instruments, etc., can solve the problems of increasing the volume of the grating measuring system and limiting the measurement accuracy, etc.

Active Publication Date: 2021-12-17
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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Problems solved by technology

[0004] The traditional four-step phase-shift structure is mostly used in homodyne grating displacement measurement systems at home and abroad. One is used as a reference grating and the other is used as a measuring grating. The diffracted light generated by the reference grating and the diffracted light generated by the measuring grating are at the polarization beam splitter Interferometry, although the cost is reduced, but the volume of the grating measurement system is increased, and the measurement accuracy is limited

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  • Homodyne one-dimensional grating displacement measurement device
  • Homodyne one-dimensional grating displacement measurement device
  • Homodyne one-dimensional grating displacement measurement device

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[0023] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, but not to limit the present invention.

[0024] figure 1 The principle of the homodyne one-dimensional grating displacement measuring device according to the embodiment of the present invention is shown.

[0025] Such as figure 1 As shown, the present invention provides a homodyne one-dimensional grating displacement measurement device provided by an embodiment, including: a single-frequency laser 1, a first polarization beam splitter prism 2, a first plane mirror 301, a second plane mirror 302, a third plane Mirror 303, fourth plane mirror 304, fifth plane mirror 305, sixth plane mirror 306, first 1 / 4 wave plate 4, dichroi...

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Abstract

The invention provides a homodyne one-dimensional grating displacement measuring device, comprising a single-frequency laser, a polarization beam splitting prism, a beam splitting prism, a plane mirror group, a quarter wave plate, two signal receiving units and a signal processing system, wherein the single-frequency laser It is used to emit a beam of linearly polarized light with a fixed frequency, which is incident to the polarizing beam splitter prism for beam splitting, and a beam is reflected to the plane mirror group, which is vertically incident to the diffraction grating through the 1 / 4 wave plate, and diffracted by the diffraction grating to generate diffracted light, which is passed through the plane mirror group, The 1 / 4 wave plate and the polarizing beam splitting prism are incident on the beam splitting prism; the other beam is symmetrical with it to generate diffracted light, and the two diffracted beams interfere to form the interference light after being split by the beam splitting prism and enter the two signal receiving units respectively. The invention can not only realize the straightness measurement of large stroke, but also realize the displacement measurement of four times subdivision of single diffraction, and can realize the displacement measurement of eight times subdivision by using right angle prism or corner prism.

Description

technical field [0001] The invention relates to the technical field of ultra-precise displacement measurement, in particular to a homodyne one-dimensional grating displacement measurement device that realizes 4-fold optical subdivision based on single diffraction and can also form a traditional four-step phase-shift structure measurement. Background technique [0002] Grating displacement measurement systems are widely used in aerospace, semiconductor manufacturing, ultra-precision machining and other fields. With the rapid development of industrial technology, the measurement dimension, measurement speed, measurement accuracy, and measurement range of ultra-precision displacement measurement technology Increasingly demanding. The grating displacement measurement system uses the grating pitch as the measurement basis to eliminate the error caused by the change of laser wavelength. Because the grating displacement measurement system has low environmental requirements, low cos...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/02G01B11/27
CPCG01B11/02G01B11/27
Inventor 吉日嘎兰图尹云飞李文昊刘兆武王玮
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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