Double-track MTJ and CMOS hybrid lookup table circuit

A look-up table and circuit technology, which is applied in the field of look-up table circuits, can solve problems such as inability to combine n-type SABL components, and achieve the effects of convenient cascade design, good portability, and improved safety

Active Publication Date: 2021-03-26
HARBIN INST OF TECH AT WEIHAI
View PDF5 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] Aiming at the problem that the existing look-up table circuit structure cannot be smoothly combined with n-type SABL elements due

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Double-track MTJ and CMOS hybrid lookup table circuit
  • Double-track MTJ and CMOS hybrid lookup table circuit
  • Double-track MTJ and CMOS hybrid lookup table circuit

Examples

Experimental program
Comparison scheme
Effect test

specific Embodiment approach 1

[0031] Specific implementation mode 1. Combination figure 1 As shown, the present invention provides a dual-rail MTJ and CMOS mixed look-up table circuit, including a unit circuit, and the unit circuit includes a sensitive amplifier circuit 100, a CMOS logic tree 200, a plurality of MTJ elements 300, an MTJ writing circuit 400, and a transistor PR 3 ,

[0032] The sensitive amplifying circuit 100 includes an inverter I 1 , Inverter I 2 , Inverter I 3 , Inverter I 4 , Transistor Pr 1 and the transistor Pr 2 ,

[0033] Inverter I 3 The output terminal of the inverter is used as the out terminal, and the inverter I 3 The input terminal is connected to the inverter I 1 output and the inverter I 2 The input terminal of the inverter I 1 The input terminal is connected to the inverter I 2 output of the inverter I 2 The output terminal of the inverter is connected to I 4 input to the inverter I 4 output as terminal; transistor Pr 1 The source is connected to the po...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a double-track MTJ and CMOS hybrid lookup table circuit, and belongs to the field of lookup table circuits. The lookup table circuit structure aims to solve the problem that anexisting lookup table circuit structure cannot be smoothly combined with an n-type SABL element due to the fact that a high level is output in the pre-charging stage. The circuit comprises a unit circuit, the unit circuit comprises a sensitive amplification circuit, a CMOS logic tree, a plurality of MTJ elements, an MTJ write-in circuit and a transistor Pr3, an inverter circuit is added to each complementary signal output end of the sensitive amplification circuit, and through the improvement, an output signal of the circuit can be kept at a low level in the pre-charging stage; and cascade design of the circuit structure is facilitated. The circuit provided by the invention has good transportability.

Description

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Owner HARBIN INST OF TECH AT WEIHAI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2023 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap