Method for measuring thickness of rubidium hydride relaxation-resistant film on inner wall of atomic gas chamber
A technology of atomic gas chamber and measurement method, which is applied in the direction of measuring devices, instruments, optical devices, etc., and can solve problems such as the preparation and optimization of atomic gas chambers that limit the anti-relaxation coating
Pending Publication Date: 2021-04-02
BEIJING INST OF AEROSPACE CONTROL DEVICES
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Problems solved by technology
[0004] However, there is currently no effective means to accurately measure the anti-relaxation film of rubidium hydride
Obviously, this greatly limits the preparation and optimization of anti-relaxation coated atomic gas cells
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[0022] Below in conjunction with accompanying drawing, the present invention is described in further detail:
[0023] A method for measuring the thickness of an atomic gas inner wall rubidium hydride anti-relaxation film layer in the present invention comprises the following steps:
[0024] (1) Prepare a quartz atomic gas chamber glass bulb with a side length of 10 mm and a wall thickness of 01 mm, and fill the glass bulb with 100 Torr of hydrogen and 0.1 mg of rubidium, and form rubidium hydride on the inner wall of the atomic gas chamber through a chemical reaction Anti-relaxation film layer;
[0025] (2), put the anti-relaxation coating atomic gas cell sample into the glove box and fix it, and use a vacuum pump to evacuate the glove box until the pressure is less than 5×10 -2 Pa, filled with 760Torr helium, cut open the sample of the atomic gas chamber;
[0026] (3) Under a helium atmosphere, use an atomic force microscope to measure the thickness of the film on the inner...
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The invention provides a method for measuring the thickness of a rubidium hydride relaxation-resistant film on the inner wall of an atomic gas chamber, and is applied to the field of atomic gas chamber test and evaluation. The method comprises the steps of firstly, physically crushing the atomic gas chamber of which the inner wall is plated with a rubidium hydride relaxation-resistant film layer in a helium atmosphere, detecting by using an atomic force microscope and a spectrum analyzer, and establishing a mapping relationship between the thickness of the relaxation-resistant film layer and the spectral transmittance according to test data of the spectral transmittance of the relaxation-resistant film layers with different thicknesses; and then based on the mapping relationship, measuringthe spectral transmittance of the atomic gas chamber to be measured by using a spectrum analyzer in a nondestructive testing mode, and fitting through a mathematical model to obtain the thickness ofthe relaxation-resistant film layer on the inner wall of the atomic gas chamber, thereby achieving nondestructive testing of the thickness of the relaxation-resistant film layer on the inner wall of the atomic gas chamber. The problem that a rubidium hydride relaxation-resistant film layer on the inner wall of an existing atomic gas chamber is difficult to effectively measure is solved.
Description
technical field [0001] The invention relates to the technical field of atomic gas chambers, in particular to a method in the field of testing and evaluation of atomic gas chambers. Background technique [0002] At present, the preparation of high-performance atomic gas chambers is one of the key issues that seriously restrict the breakthrough of new quantum instruments such as nuclear magnetic resonance gyroscopes and spin exchange relaxation free (SERF) gyroscopes to high precision and practical applications. Among them, the realization of long transverse relaxation time inert gas atomic ensembles in small-sized gas cells is the key to improving the performance of quantum instruments and pushing them to practical use at this stage. [0003] The anti-relaxation coating on the inner wall of the gas is an effective means to increase the spin relaxation time of the macroscopic atoms, which can make the atoms not lose their polarization state after multiple collisions with the i...
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IPC IPC(8): G01B11/06G01Q60/24
CPCG01B11/06G01Q60/24
Inventor郑建朋李新坤何娇刘院省蔡玉珍王风娇黄伟赵雄邓意成王学锋
OwnerBEIJING INST OF AEROSPACE CONTROL DEVICES