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Binocular vision three-dimensional point cloud reconstruction measurement method for sinusoidal grating and speckle mixed pattern projection

A sinusoidal grating, binocular vision technology, applied in measurement devices, projection reproduction, 2D image generation, etc., can solve the problems of reduced measurement speed, difficult error diffusion, lack of accuracy in random digital speckle measurement, etc. False matching rate, improving measurement accuracy, and improving the effect of reconstruction accuracy

Inactive Publication Date: 2021-04-02
TIANJIN UNIV
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Problems solved by technology

[0003] In the single-projection dual-camera measurement structure based on projected digital speckle, the speckle image is affected by factors such as the stability of the projection system and the resolution of the camera, as well as the quality of the speckle itself, resulting in the accuracy of random digital speckle measurement compared to The projected grating phase method is deficient
[0004] In the single-projection dual-camera measurement structure based on the projected phase-shift grating, the projected grating three-dimensional measurement method has high measurement accuracy, but this method reduces the measurement speed due to the difficulty and error diffusion caused by the cumbersome unwrapping phase process.

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  • Binocular vision three-dimensional point cloud reconstruction measurement method for sinusoidal grating and speckle mixed pattern projection
  • Binocular vision three-dimensional point cloud reconstruction measurement method for sinusoidal grating and speckle mixed pattern projection
  • Binocular vision three-dimensional point cloud reconstruction measurement method for sinusoidal grating and speckle mixed pattern projection

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[0039] Attached below figure 1 , 2, 3, 4, 5, 6 and specific examples describe the technical solution of the present invention in further detail, and the described specific examples are only for explaining the present invention, and are not intended to limit the present invention.

[0040] The invention discloses a binocular vision three-dimensional point cloud reconstruction measurement method based on sinusoidal grating and speckle mixed pattern projection, and aims to provide a projected structured light system based on binocular vision, which can reduce the number of projections and simplify the measurement method , to avoid the complicated phase unwrapping process, so as to realize a fast and high-precision three-dimensional measurement method of structured light vision, the specific implementation system is as follows figure 1 shown.

[0041] The specific implementation process is as figure 2 As shown, it includes five steps: digital speckle design, sinusoidal grating ...

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Abstract

The invention belongs to the field of binocular vision three-dimensional measurement and precision measurement, and particularly relates to a binocular vision three-dimensional measurement method forsinusoidal grating and speckle mixed pattern projection. The method is characterized by comprising five parts of implementation based on a binocular single-projection hardware system, digital speckledesign, sinusoidal grating stripe design, speckle and stripe image fusion, pattern projection and image information extraction, and speckle and phase shift matching algorithm flow. The invention aimsto provide a rapid projection phase shift grating method for improving the reconstruction speed from two angles of a projection mode and a matching algorithm. According to the method, the unwrapping process of a traditional projection phase shift grating method and the tedious step that multiple sets of multi-step phase shift stripes need to be projected when a multi-frequency heterodyne method isadopted are avoided, compared with speckle matching, the reconstruction precision of the method is improved, the sinusoidal grating and speckle mixed pattern is projected to the measured object, andin combination with a corresponding matching algorithm, the speed and the precision of three-dimensional measurement are improved.

Description

technical field [0001] The invention relates to the field of binocular vision three-dimensional measurement and precision measurement, in particular to a binocular vision three-dimensional point cloud reconstruction measurement method for sinusoidal grating and speckle mixed pattern projection. Background technique [0002] Projection structured light technology is widely used in binocular vision active measurement. Optical 3D measurement has a series of advantages such as non-contact, non-destructive, fast measurement, high precision, and high degree of automation. It has become the fastest-growing technology in 3D data acquisition in recent years. It is one of the most widely used and most promising methods, and it is the key technology of current scientific research and engineering application. [0003] In the single-projection dual-camera measurement structure based on projected digital speckle, the speckle image is affected by factors such as the stability of the projec...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/25G06T17/00G06T11/00
CPCG01B11/254G06T17/00G06T11/003G06T2207/10028
Inventor 徐恋隐张福民曲兴华张园钧梁晓博
Owner TIANJIN UNIV
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