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A microled or miniled defect detection method and device

A defect detection, to-be-tested technology, used in measuring devices, optical testing flaws/defects, optical instrument testing, etc., to solve problems such as inability to efficiently detect multi-color wavelength light intensity

Active Publication Date: 2021-07-06
WUHAN JINGCE ELECTRONICS GRP CO LTD +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] In view of the above defects or improvement needs of the prior art, the present invention provides a Microled or Miniled defect detection method and device to solve the problem that the prior art cannot quickly and efficiently detect the multi-color wavelength light intensity of the Microled or Miniled device unit technical problem

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  • A microled or miniled defect detection method and device
  • A microled or miniled defect detection method and device
  • A microled or miniled defect detection method and device

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Embodiment Construction

[0034] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0035] In addition, the technical features involved in the various embodiments of the present invention described below can be combined with each other as long as they do not constitute a conflict with each other. The present invention will be further described in detail below in combination with specific embodiments.

[0036] In one embodiment, a Microled or Miniled defect detection method is provided, the method comprising:

[0037] Set the wavelength selection module, focus module and detection module corresponding to the module to be tested, the wavelength selection module, focus module and de...

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Abstract

The invention discloses a Microled or Miniled defect detection method and device, which is provided with a wavelength selection module, a focusing module and a detection module corresponding to the module to be tested, and the wavelength selection module, the focusing module and the detection module are respectively provided with the Microled Or the light-emitting basic unit of Miniled has one-to-one corresponding wavelength selection unit, focusing unit and detection unit; using the wavelength selection unit to selectively transmit one or more lights of different wavelength ranges emitted by the light-emitting basic unit to different subunits of the focusing unit, through The light received by different subunits of the focusing unit is focused to different subunits of the detection unit, and the light intensity data corresponding to the light emitted by the light-emitting basic unit corresponding to different wavelength ranges is obtained through the light intensity detection data of different subunits of the detection unit, so as to realize Fast and efficient detection of light intensity characteristics corresponding to multiple different wavelength ranges for each luminous basic unit on Microled or Miniled.

Description

technical field [0001] The invention belongs to the technical field of module testing, and in particular relates to a Microled or Miniled defect detection method and device. Background technique [0002] Compared with the OLED widely used today, Microled or Miniled has high brightness, high resolution, long life, low power consumption, and fast response speed. There are many technical challenges such as packaging heat dissipation and integrated drivers. These problems not only increase the production cost of Microled or Miniled, but also restrict the commercial application of products. [0003] In practical applications, the uniformity of the device parameters of Microled or Miniled is a factor that greatly affects the quality of image color rendering. However, due to the size of the basic light-emitting unit of Microled or Miniled, which is limited by size, the current detection technology of Microled or Miniled There is almost no proposal for a reliable detection scheme f...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01M11/02G01N21/95
CPCG01M11/0278G01N21/95G01N2021/9511
Inventor 范景洋洪志坤夏珉欧昌东郑增强
Owner WUHAN JINGCE ELECTRONICS GRP CO LTD
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