Mineralogical parameter fitting analysis method based on multiple mapping images

Abstract

The invention discloses a mineralogy parameter fitting analysis method based on multiple Mapping images, comprising the following steps: S1, performing scanning imaging of multiple Mappings on samples, and taking pictures under a microscope at the same time; S2, scanning the Mapping images Adjust to a grayscale mosaicized image; S3, perform correction processing; S4, perform image conversion matrix data processing; S5, convert matrix data into XYZ three-column data worksheets; S6, merge worksheets; S7, perform error Eliminate the processing to obtain a multi-imaging fitting analysis summary table; S8. According to the imaging data in the multi-imaging fitting analysis summary table, fit a regular linear or curved relationship to obtain a pixel value equation; S9. According to the pixel value With their respective conversion formulas, the pixel point equations are converted into relationship equations between Mapping parameters, and the regular equations of real parameters are obtained. The parameter fitting analysis method of the present invention has the advantages of simple operation, rich data amount and accurate position fitting compared with the traditional dot analysis.

Description

technical field [0001] The invention relates to a mineralogical parameter fitting analysis method based on multiple Mapping images. Background technique [0002] Mapping analysis can be more extensive and comprehensively reflect the physical and chemical information of each area of ​​the entire target sample compared to dot analysis, and is currently widely used in the fields of geology, biology, and materials. [0003] However, the predecessors' imaging analysis of Mapping often stayed at the distinction and comparison of the naked eye to obtain laws and phenomena. When it comes to more specific fitting equation relationships, they often still rely on instrumentation for analysis. For the mapping in Mapping The data could not be well applied due to the inability to derive the true value or other reasons, and the main analysis and fitting method was still using dots. However, compared with Mapping imaging analysis, Mapping analysis has the disadvantages of cumbersome operat...

AI Technical Summary

Problems solved by technology

[0003] However, for the imaging analysis of Mapping, the predecessors often stayed in the rules and phenomena obtained through the distinction and comparative observation of the naked eye. When it comes to more specific fitting equations, they often still rely on instrumentation for analysis. The data has not been well applied due to the inability to derive the true value or other reasons, and the main analysis and fitting method is still using dots

However, compared with Mapping imaging analysis, dot analysis has the disadvantages of cumbersome operation, difficult alignment of points, and too few points. Therefore, a new technical method of fast and accurate Mapping transfer data with reliable results is needed.

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