Design method of miniaturized focal plane array test data acquisition and display system

Abstract

The invention relates to a design method of a miniaturized focal plane array test data acquisition and display system, which comprises the following steps: S1, determining the overall architecture of the focal plane array test data acquisition and display system; S2, in a lower computer, carrying out digital logic design on an FPGA part in the SoC chip, providing a working time sequence needed by the focal plane array, collecting data obtained by the focal plane array, wherein a working time sequence signal is synchronized with a main clock; s3, in the lower computer, performing high-level language program design on an ARM part in the SoC chip, and processing interrupt requests respectively from the FPGA and the upper computer by adopting a double-interrupt technology to realize data exchange between the upper computer and the lower computer; and S4, in the upper computer, designing a graphical interface by adopting a .NET framework to control the lower computer, realizing data receiving and decoding, and displaying the decoded data in real time in a three-dimensional or two-dimensional mode by utilizing OpenTK.

Description

technical field [0001] The invention relates to the technical fields of electronic product testing technology and computer program design, in particular to a design method for miniaturized focal plane array test data collection and display system. Background technique [0002] In order to evaluate the performance of the focal plane array, the focal plane array needs to be tested during the development and production stages of the focal plane array. The test method is: after applying voltage and light to the focal plane array, apply control signals according to the working timing of different types of focal plane arrays, and collect the output data of the focal plane array, and monitor the working temperature of the focal plane array at the same time; for the collected data , using a computer for data processing to realize the display of test data. However, the traditional test method requires the use of signal generators, logic analyzers and other instruments, the operation...

AI Technical Summary

Problems solved by technology

However, some of these test systems need to rely on third-party equipment, and the development cost is high; some need to use early glue logic in the FPGA for test data integration, which is complex and difficult to maintain; the timing signals generated by the FPGA in some test systems Not synchronized with the master clock, risking data capture confusion

In terms of user interface design, some test systems in the past were written in OpenGL in Visual C++, which was difficult to develop, poor maintainability, and the reliability of the program needs to be improved; and the general 3D graphics display module contains complex The data processing program causes the program to run at a slower speed, which is not conducive to the real-time display of the focal plane array data

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