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Monolithic magnetic property measuring device based on spatial orthogonal triaxial stress loading condition

A technology of triaxial stress and measuring device, applied in the direction of magnetic performance measurement, etc., can solve the problem of reducing the excitation effect of the magnetic circuit, and achieve the effect of overcoming measurement limitations, good low temperature resistance, and good corrosion resistance.

Active Publication Date: 2021-06-18
HEBEI UNIV OF TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, the disadvantage of this invention is that it can only apply stress in a uniaxial fixed direction, and the measurement target sample is a block sample, so the scope of application of the device is limited
In addition, the device places the B-H sensing coils required for measurement on the four excitation surfaces of the sample, which reduces the excitation effect of the magnetic circuit

Method used

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  • Monolithic magnetic property measuring device based on spatial orthogonal triaxial stress loading condition
  • Monolithic magnetic property measuring device based on spatial orthogonal triaxial stress loading condition
  • Monolithic magnetic property measuring device based on spatial orthogonal triaxial stress loading condition

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Embodiment Construction

[0062] Specific examples of the present invention are given below. The specific embodiments are only used to further describe the present invention in detail, and do not limit the protection scope of the claims of the present application.

[0063] The present invention provides a monolithic magnetic characteristic measurement device (referred to as the measurement device) under the condition of spatially orthogonal triaxial stress loading, which is characterized in that the measurement device is as figure 1 As shown, it includes control module I, excitation module II, triaxial stress application module III (including X-axis, Y-axis stress application structure III-1 and Z-axis stress application structure III-2) and measurement module IV;

[0064] The control module I includes a PA100-52A power amplifier and an industrial computer (the invention is specifically a Lenovo computer); the industrial computer is used to send an excitation signal to the excitation module II, send a ...

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Abstract

The invention relates to a monolithic magnetic property measuring device based on a spatial orthogonal triaxial stress loading condition. The measuring device comprises a control module, an excitation module, a triaxial stress applying module and a measuring module. According to the measuring device, a required measuring sensor is arranged in a compression column in a z-axis compressive stress structure, a B sensor is a B probe measuring sensor, an H sensor is a double-coil sensor, and a measuring sample is designed to be a cross-shaped monolithic sample with continuous curvature radian. Spatial orthogonal triaxial stress applying directions of the measuring device are X-axis and Y-axis directions in a plane and Z-axis directions in a space, pulling (pressing) stress is applied to the X-axis and the Y-axis through a traction motor, and pressing stress is applied to the Z-axis direction through a hydraulic press. The measuring device is used for measuring the magnetic characteristics of a single sample under a spatial orthogonal triaxial stress loading condition.

Description

technical field [0001] The invention relates to a sample magnetic characteristic measurement device under stress loading conditions, in particular to a single-chip magnetic characteristic measurement device under space orthogonal triaxial stress loading conditions. Background technique [0002] Magnetic properties measurement is to reflect the magnetic properties of the sample to be tested through the detected B-H curve. In the current measurement process, in order to protect the measurement sample from damage, the B probe is often used to collect the B signal, and the H sensor coil is mounted on the sample surface to collect the H signal, and the collected B and H signals are transmitted to the digital signal processing through the NI acquisition card unit. In order to ensure the accuracy of the measurement results, the measuring H-coil sensor needs to be close to the surface of the sample. If the H-sensing coil cannot be completely attached to the sample surface, multi-se...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R33/12
CPCG01R33/12
Inventor 张长庚陈涛李永建杨庆新
Owner HEBEI UNIV OF TECH
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