Method for dynamically monitoring crack tip stress intensity factor
A technology of stress intensity factor and crack tip, which is applied in the measurement of the change force of its optical properties when the material is stressed, the strength characteristics, and the use of stable tension/pressure to test the strength of the material, etc., can solve the quantitative analysis of mechanical damage Difficult, unable to directly and accurately determine the fluorescence boundary and intensity, discontinuous distribution of fluorescence intensity, etc., to achieve the effect of low cost, rapid response, and wide application range
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0075] The specific detection method roadmap is as follows: figure 1 shown.
[0076] (1) Select the organic luminescent material tetranitro-tetraphenylethylene (TPE-4N) as the material; or use chemical methods to synthesize. For the synthesis method, see the Chinese invention patent "Preparation and application of polynitro-substituted tetraphenylethylene compounds" (invention patent application number: CN 201310057959 publication number: CN104003886A).
[0077] (2) Prepare TPE-4N solution, coat the surface of metal components, and heat to form a film.
[0078] Sample 1: Dissolve TPE-4N in chloroform to prepare a TPE-4N solution with a concentration of 0.01g / mL, apply the solution on the metal surface with a brush, and heat it at 80°C for 30 minutes with a heat gun to form a film.
[0079] Sample 2: Dissolve TPE-4N in chloroform to prepare a TPE-4N solution with a concentration of 0.03g / mL, apply the solution on the metal surface with a brush, and heat it at 150°C for 2 min...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com