Chip detection method and chip detection device

Abstract

The invention relates to the technical field of integrated circuit failure analysis, in particular to a chip detection method and a chip detection device. The chip detection method comprises the following steps of providing a chip to be tested, wherein the chip is provided with a plurality of one-time programmable memories, transmitting a test signal to the chip, so that the one-time programmable memory in the chip is kept in a latch state, and detecting whether the chip emits a low-light signal or not, and if so, determining that the one-time programmable memory has an electric leakage defect. Not only can the one-time programmable memories which are burnt through mistakenly be detected, but also the one-time programmable memories with relatively slight electric leakage conditions can be detected, so that bad products with potential burn-through risks are prevented from flowing into subsequent production lines.

Description

technical field [0001] The invention relates to the technical field of integrated circuit failure analysis, in particular to a chip detection method and a chip detection device. Background technique [0002] A dynamic random access memory (Dynamic Random Access Memory, DRAM) is a semiconductor structure commonly used in electronic devices such as computers, and is composed of a plurality of storage units, and each storage unit usually includes a transistor and a capacitor. The gate of the transistor is electrically connected to the word line, the source is electrically connected to the bit line, and the drain is electrically connected to the capacitor. The word line voltage on the word line can control the opening and closing of the transistor, so that the bit line can be used to read the data stored in the capacitor. The data information in, or write the data information into the capacitor. [0003] Chips such as DRAM generally include several one-time programmable memorie...

AI Technical Summary

Problems solved by technology

[0005] The invention provides a chip detection method and a chip detection device, which are used to solve the problem of low accuracy of chip detection in the prior art, so as to prevent defective products with potential risks from flowing into subsequent production lines and improve the yield rate of final chip products

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