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Thermal infrared detector performance testing method

A technology of infrared detectors and testing methods, applied in the direction of electric radiation detectors, etc., can solve the problems of lack of performance self-testing methods, etc., and achieve the effect of low testing cost, simple testing equipment, and easy operation

Active Publication Date: 2021-07-09
WUXI INNOVATION CENT CO LTD
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Problems solved by technology

[0006] The present invention provides a thermal infrared detector performance test method, which solves the problem of lack of a simple and easy performance self-test method using purely electrical excitation in the related art

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Embodiment Construction

[0043] It should be noted that, in the case of no conflict, the embodiments of the present invention and the features in the embodiments can be combined with each other. The present invention will be described in detail below with reference to the accompanying drawings and examples.

[0044] In order to enable those skilled in the art to better understand the solutions of the present invention, the following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only Embodiments of some, but not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts shall fall within the protection scope of the present invention.

[0045] It should be noted that the terms "f...

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Abstract

The invention relates to the technical field of thermal infrared detector testing, and particularly discloses a thermal infrared detector performance testing method, which comprises the following steps of: placing a thermal infrared detector in a vacuum environment with the environment temperature of 50 DEG C; constant current source bias current is used for applying self-heating power of the duration to the detector, and the output voltage variation when the thermal infrared detector reaches thermal balance is recorded; the surface temperature of the thermal infrared detector is calculated according to the output voltage variation-surface temperature function relation, and the thermal conductivity value of the thermal infrared detector is calculated according to the self-heating power-thermal conductivity function relation; a thermal conductivity-surface temperature function relationship is established; the emissivity of the thermal infrared detector is obtained, and the infrared absorptivity is obtained according to the emissivity; the noise of the thermal infrared detector is obtained; and the noise equivalent temperature difference is measured according to the function relationship of equivalent temperature difference-noise-infrared absorptivity. The thermal infrared detector performance test method provided by the invention is simple in test, and performance self-test is carried out by utilizing pure electrical excitation.

Description

technical field [0001] The invention relates to the technical field of testing thermal infrared detectors, in particular to a method for testing the performance of thermal infrared detectors. Background technique [0002] Infrared radiation is the most widespread electromagnetic radiation in nature. Any object radiates infrared energy continuously, so infrared radiation can provide rich information about the objective world. However, since the human eye cannot detect infrared radiation, the infrared detector is particularly important as a key device for infrared information acquisition. Thermal infrared detectors, as a kind of infrared detectors, are widely used in many fields such as national defense, thermal imaging temperature measurement, and commercial vision due to their low manufacturing cost, stable and reliable performance, small size, light weight, and low power consumption. [0003] Thermal infrared detectors use thermistors, diodes, thermopiles, etc. as heat-sen...

Claims

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Application Information

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IPC IPC(8): G01J5/20
CPCG01J5/20
Inventor 侯影傅剑宇刘超陈大鹏
Owner WUXI INNOVATION CENT CO LTD
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