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A kind of thermal infrared detector performance testing method

A technology of infrared detectors and testing methods, applied in the direction of electric radiation detectors, etc., can solve the problems of lack of performance self-testing methods, etc., and achieve the effects of low testing costs, easy operation, and simple testing equipment

Active Publication Date: 2022-04-12
WUXI INNOVATION CENT CO LTD
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Problems solved by technology

[0006] The present invention provides a thermal infrared detector performance test method, which solves the problem of lack of a simple and easy performance self-test method using purely electrical excitation in the related art

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  • A kind of thermal infrared detector performance testing method
  • A kind of thermal infrared detector performance testing method

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Embodiment Construction

[0043] It should be noted that, in the case of no conflict, the embodiments of the present invention and the features in the embodiments can be combined with each other. The present invention will be described in detail below with reference to the accompanying drawings and examples.

[0044] In order to enable those skilled in the art to better understand the solutions of the present invention, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only Embodiments of some, but not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts shall fall within the protection scope of the present invention.

[0045] It should be noted that the terms "first" and "second...

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Abstract

The invention relates to the technical field of thermal infrared detector testing, and specifically discloses a thermal infrared detector performance testing method, which includes: placing the thermal infrared detector in a vacuum environment with an ambient temperature of The source bias current is the self-heating power of the detector applied for a period of , and the output voltage variation of the thermal infrared detector is recorded when it reaches thermal equilibrium; the surface temperature of the thermal infrared detector is calculated according to the output voltage variation-surface temperature function relationship, Calculate the thermal conductivity value of the thermal infrared detector according to the self-heating power-thermal conductivity function relationship; establish the thermal conductivity-surface temperature function relationship; obtain the emissivity of the thermal infrared detector, and obtain the infrared absorption rate according to the emissivity; obtain the thermal type The noise of the infrared detector; according to the functional relationship of the equivalent temperature difference-noise-infrared absorption rate, the noise equivalent temperature difference is measured. The performance testing method of the thermal infrared detector provided by the invention is simple and uses pure electrical excitation to perform performance self-test.

Description

technical field [0001] The invention relates to the technical field of testing thermal infrared detectors, in particular to a method for testing the performance of thermal infrared detectors. Background technique [0002] Infrared radiation is the most widespread electromagnetic radiation in nature. Any object radiates infrared energy continuously, so infrared radiation can provide rich information about the objective world. However, since the human eye cannot detect infrared radiation, the infrared detector is particularly important as a key device for infrared information acquisition. Thermal infrared detectors, as a kind of infrared detectors, are widely used in many fields such as national defense, thermal imaging temperature measurement, and commercial vision due to their low manufacturing cost, stable and reliable performance, small size, light weight, and low power consumption. [0003] Thermal infrared detectors use thermistors, diodes, thermopiles, etc. as heat-sen...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01J5/20
CPCG01J5/20
Inventor 侯影傅剑宇刘超陈大鹏
Owner WUXI INNOVATION CENT CO LTD
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