Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Unpacking method based on binary feature pattern matching

An eigenmode and unwrapping technology, applied in the field of three-dimensional measurement, can solve the problem that the spatial unwrapping algorithm cannot isolate the phase expansion of objects

Active Publication Date: 2021-07-20
SOUTHEAST UNIV
View PDF5 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] Technical issue: Traditional spatial unwrapping algorithms are limited due to their inability to phase unwrap isolated objects, while temporal unwrapping algorithms are widely used due to their robustness

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Unpacking method based on binary feature pattern matching
  • Unpacking method based on binary feature pattern matching
  • Unpacking method based on binary feature pattern matching

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0054] In order to describe the technical content, structural features, achieved goals and effects of the present invention in detail, the present invention will be described in detail below in conjunction with the accompanying drawings.

[0055] refer to figure 1 , in order to solve the problem of principal value phase unwrapping in the present invention, the technical solution adopted is an unwrapping method based on binary eigenpattern matching, comprising the following steps:

[0056] Step 1: Use the speckle image to design a feature binary image, the speckle image formula is as follows:

[0057]

[0058] where N represents the total number of simulated speckle, R represents the maximum diameter of simulated speckle, I 0 Indicates the light intensity of the simulated speckle, that is, the gray level of the speckle image, (x k ,y k ) is the coordinates of the center of the speckle. Then using the threshold T sanban Divide it into binary feature images, the specific ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses an unpacking method based on binary feature pattern matching. The method is different from a traditional binocular matching system, and the absolute phase of the measured object can be obtained only through one camera and one projector. According to the method, a principal value phase of a standard plane, a stripe order corresponding to the principal value phase and a binarized feature image need to be acquired in advance. When a measured object is measured, firstly, pre-matching is carried out by utilizing a main value phase of the measured object and a main value phase of a standard plane, then accurate matching is carried out through a binary feature image modulated by the measured object and a binary feature image of the standard plane, and then complementation processing is carried out on unmatched points, so an accurate absolute phase can be obtained. According to the method provided by the invention, the stripe order can be correctly solved according to the measurement conditions of a plurality of isolated objects, an additional picture is needed for unwrapping operation, and the unwrapping speed is improved while the unwrapping robustness is ensured.

Description

technical field [0001] The invention relates to an unwrapping method based on binary feature pattern matching, and belongs to the technical field of three-dimensional measurement. Background technique [0002] Optical 3D measurement has become a research hotspot in the field of computer vision. Structured light has the advantages of fast speed, high precision, wide measurement range, and wide material adaptability. It is one of the most commonly used optical three-dimensional measurement technologies, so it is widely used in manufacturing, industrial inspection, medicine, human-computer interaction and other fields. . Among them, the phase-based 3D reconstruction technology has been widely used due to its high-precision characteristics. To obtain the 3D shape of the measured object, it is necessary to obtain the principal value phase of the measured object and unfold it. [0003] There are two methods to obtain the principal value phase, which are Fourier transform profilo...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/25G06T7/00G06T7/136
CPCG01B11/254G06T7/0002G06T7/136G06T2207/10012
Inventor 达飞鹏文浩
Owner SOUTHEAST UNIV
Features
  • Generate Ideas
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2025 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com