Static parameter testing system and method, electronic equipment and storage medium

Abstract

The invention relates to a static parameter testing system and method, electronic equipment and a storage medium, and the system comprises at least one of a first measurement module, a second measurement module, a third measurement module, a fourth measurement module, a fifth measurement module and a sixth measurement module. The first measuring module, the second measuring module, the third measuring module, the fourth measuring module, the fifth measuring module and the sixth measuring module are connected with a measuring clamp through a switching module, and the first measuring module, the second measuring module, the third measuring module, the fourth measuring module, the fifth measuring module and the sixth measuring module are connected through a bus. The problems that in the prior art, a solid-state microwave power device static parameter measuring system is inaccurate in measuring result, complex in testing system structure, large in size and heavy in mass are solved.

Description

technical field [0001] The invention relates to the field of test and measurement, in particular to a static parameter test system, method, electronic equipment and storage medium. Background technique [0002] At present, the performance of traditional Si and GaAs semiconductor devices is close to the theoretical limit determined by the material itself. Semiconductor materials such as silicon carbide (SiC) and gallium nitride (GaN) have wide Through the advantages of electric field and other advantages, it has become an ideal material for the development of high-power, high-frequency, high-temperature and radiation-resistant electronic devices. The GaN material series has low heat generation rate and high breakdown electric field, and is suitable for the development of radiation-resistant, high-frequency, high-density integrated electronic devices. Semi-insulating SiC single crystal material has become the best substrate for preparing wide-bandgap solid-state microwave dev...

AI Technical Summary

Problems solved by technology

[0007] In view of the above technical problems, this application proposes a static parameter testing system, method, electronic equipment and storage medium to solve the problem of large differences in measurement results, inaccurate measurement results, and The problem of complex structure, large volume and heavy weight of the test system

Images