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Sampling sleeve capable of preventing dust and removing dust, mass spectrum sampling interface and mass spectrum sampling method

A sampling tube and casing technology, applied in the field of analytical instruments, can solve problems such as interface blockage, high boiling point gas condensation and deterioration, material deterioration, etc., and achieve the effect of avoiding influence

Pending Publication Date: 2021-08-17
INST OF ENGINEERING THERMOPHYSICS - CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, in the actual reaction process, the gas is often mixed with a large amount of impurities. The sample collection process requires an independent design of the pre-treatment device. The existing filter devices are all filtered at room temperature. During the reaction process, the high-boiling point gas will condense and deteriorate at room temperature, which will affect the accuracy of the measurement results.
At the same time, in a complex environment, the material to be sampled often contains dust. Since the existing commercial sampling interface is not designed with a filter device, when the dust enters the sampling interface with the airflow, large particle size particles are likely to cause the interface to block and affect the sampling work.
For example, the diameter of the sampling hole of the capillary sampling interface is 50-80 μm, and the dust of tens of μm can block the capillary or core components, eventually leading to hardware short circuit and mass spectrometry damage, so it cannot cope with the complex ash and corrosive environments in actual measurement; Skimmer Except that the sampling interface is easy to be blocked, Al 2 o 3 Or the interface made of stainless steel is easy to react with the salt contained in the dust to form an alloy, which affects the normal sampling
[0003] In addition, if the dust is brought into the mass spectrometer by vacuum, it will seriously contaminate the core components such as the ion source and mass analyzer. If the dust enters the core components, the core components will cause an instantaneous short circuit and damage the mass spectrometer hardware.
[0004] The gas to be sampled is often in a high-temperature complex reaction state, containing a large amount of dust and condensed and deteriorated gas, while the conventional filter device will suffer material deterioration and cannot be used in a high-temperature environment, and high-boiling point gases will also condense and deteriorate, so it is urgently needed A mass spectrometry sampling interface that is resistant to dust contamination and can be used in complex reaction environments at high temperatures

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  • Sampling sleeve capable of preventing dust and removing dust, mass spectrum sampling interface and mass spectrum sampling method
  • Sampling sleeve capable of preventing dust and removing dust, mass spectrum sampling interface and mass spectrum sampling method

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Embodiment Construction

[0035] Specific embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings. It should be understood that the following descriptions are illustrative only, rather than limiting the scope of the present invention and its application.

[0036] The current sampling interfaces of mass spectrometers are mainly divided into two categories: capillary and Skimmer. Skimmer can collect gas in situ at the same temperature, but it is not easy to disassemble and clean. The capillary sampling interface is easy to disassemble and clean, but the temperature can only be maintained at 230°C. These two types of sampling interfaces have many theoretical and technical defects, which cannot meet the high-temperature state sampling of full-component gases in complex reaction processes. In addition, the material to be sampled in a complex environment often contains a large amount of impurities (such as dust), and the current sampling interface...

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Abstract

The invention provides a sampling sleeve capable of preventing dust and removing dust, a mass spectrum sampling interface and a mass spectrum sampling method. The sampling sleeve is connected with the two stages of sampling ends through a pneumatic rotational flow piece, the whole sampling connector arrangement conforms to the aerodynamics and heat transfer principle, the stability of gas is kept in vacuum supersonic flow, the gas in the dynamic temperature change state can be sampled at high temperature, and tiny particles which are not completely filtered are discharged through centrifugal force; and the sampling sleeve can be suitable for measuring various complex gas phase components by various microsampling gas analyzers. Under the condition that the gas state is not changed, the dust limit can be effectively filtered to 5 microns, and the dust filter can work for a long time in dust and corrosive environments.

Description

technical field [0001] The invention relates to the field of analytical instruments, in particular to a sampling sleeve, a sampling interface and a use method thereof which can be used for mass spectrometry analysis. Background technique [0002] As a high-end gas analysis equipment, mass spectrometer is widely used in gas detection in various industries. Sampling is a key step in mass spectrometry. At present, the sampling of mass spectrometer products is first-level sampling, and the substances to be sampled in the sampling space directly enter the mass spectrometer through the sampling interface. The sampling interfaces of existing commercial mass spectrometers mainly include capillary sampling interfaces and Skimmer sampling interfaces. Commercial mass spectrometry manufacturers require pure gas sampling for the collection of gas samples, so neither of these two sampling interfaces are designed with filter devices. However, in the actual reaction process, the gas is of...

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Application Information

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IPC IPC(8): H01J49/04G01N27/62
CPCH01J49/0422H01J49/0404G01N27/62
Inventor 魏凯黄倩夏红德
Owner INST OF ENGINEERING THERMOPHYSICS - CHINESE ACAD OF SCI