Optical time delay measurement method and device based on optical vector analysis
A time-delay measurement and optical vector technology, applied in the field of optical measurement, can solve problems such as limited measurement accuracy, inability to measure narrow-band optical devices and long optical fiber links, and inability to have time-domain resolution capabilities, so as to achieve good use flexibility, The effect of high application value and high measurement accuracy
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[0030] Aiming at the deficiencies of the existing technology, the solution idea of the present invention is to use a special detection optical signal to perform reflective measurement, and to perform optical delay measurement with time-domain resolution based on optical vector analysis, so as to simultaneously obtain ultra-long measurement distance and High time domain resolution and delay measurement accuracy.
[0031] The optical delay measurement method based on optical vector analysis proposed by the present invention is specifically as follows: use a microwave sweep signal to modulate the intensity of a single-frequency optical carrier whose frequency changes periodically with time; then input the generated modulated optical signal to be measured Optical link and convert the reflected modulated optical signal into an electrical signal; extract the amplitude and phase information of the electrical signal and perform inverse Fourier transform on it to obtain the time-domai...
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