On-line filter stack spectrometer

Abstract

The invention discloses an on-line filter stack spectrometer, which comprises a ray sensitive unit formed by at least one diamond detector and a plurality of scintillator detectors in sequence in a stack manner, and a photoelectric conversion unit for receiving visible light signals generated by the scintillator detectors in the ray sensitive unit through optical fibers and converting the visible light signals into electric signals, an electronic system which is used for receiving current pulse signals generated by a diamond detector in the ray sensitive unit and electric signals output by the photoelectric conversion unit and processing the current pulse signals and the electric signals into digital signals, a deflection magnet which is used for deflecting high-energy electrons emitted along with X rays, and an aiming camera which is used for being aligned with an X-ray source. According to the invention, a ray sensitive unit adopts a filter disc stack mode formed by combining a diamond detector and a scintillator detector, and an electronic system is combined to process and adopt an electric signal at a high speed, so that the on-line real-time measurement of a wide-energy-band (10keV-10MeV) pulse type X-ray source energy spectrum is realized.

Description

technical field [0001] The invention relates to a spectrometer, in particular to an on-line filter stack spectrometer. Background technique [0002] The high-brightness, ultra-short-pulse X-ray source driven by laser or accelerator, due to its short pulse width, micro-focus, wide energy spectrum and other characteristics, has great potential in the fields of non-destructive testing, biomedical imaging, and scientific research on ultra-fast microscopic processes. Wide application prospects. The energy spectrum of an X-ray source is one of its most important characteristics, which is of great value for the application and research of X-ray sources. The energy spectrum of this kind of X-ray source can cover the range from keV to tens of MeV, and combined with the characteristics of the pulsed radiation field, the energy spectrum measurement technology is diversified. [0003] The existing energy spectrum measurement technologies are generally divided into four categories: 1) ...

AI Technical Summary

Problems solved by technology

However, in the spectrometer design of Behm et al., the filters and scintillators only use lead and CsI with the same thickness, and the detection efficiency of high-flux X-rays with energy lower than 100keV is low.

Using CCD to measure scintillator optical signal, the spectrometer integration level is low, it is difficult to apply in the vacuum target chamber with limited space; the cost of using CCD is high, the exposure and readout time of CCD is long (milliseconds to ten milliseconds), and it is impossible to distinguish the secondary Noise; and the CCD is not optically coupled to the scintillator, the light collection efficiency is uncertain, and it is difficult to accurately and quantitatively describe the intensity of the incident X-rays

[0009] To sum up, for a pulsed X-ray source energy spectrum measurement system, to ensure high detection efficiency and online real-time energy spectrum measurement capability in a wide energy range (10keV ~ 10MeV), there is no good one at present. Design

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