Double-pulse test system
A test system, double-pulse technology, applied in circuit breaker testing, single semiconductor device testing, etc., can solve problems such as inability to provide accurate and reliable data, difficulty in covering various working conditions with basic data, and inability to meet double-pulse testing, etc. , to achieve the effect of realizing automated testing, improving testing efficiency, and improving testing accuracy
Pending Publication Date: 2021-11-05
LEADRIVE TECH (SHANGHAI) CO LTD +1
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Problems solved by technology
[0004] However, in the existing double-pulse test schemes, such as manual test methods, such as semi-automated test schemes, etc., a large number of double-pulse tests require a lot of manual participation, such as adjusting pulse width, recording data, judging correctness, etc., which is not only time-consuming It is laborious and may not meet the needs of a large number of double-pulse tests, and it is difficult to cover various working conditions with the basic data provided by manual participation, and cannot provide accurate and reliable data for subsequent optimization processing
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[0021] Embodiments of the present application will be described in detail below in conjunction with the accompanying drawings.
[0022] Embodiments of the present application are described below through specific examples, and those skilled in the art can easily understand other advantages and effects of the present application from the content disclosed in this specification. Apparently, the described embodiments are only some of the embodiments of this application, not all of them. The present application can also be implemented or applied through other different specific implementation modes, and various modifications or changes can be made to the details in this specification based on different viewpoints and applications without departing from the spirit of the present application. It should be noted that, in the case of no conflict, the following embodiments and features in the embodiments can be combined with each other. Based on the embodiments in this application, all...
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The invention provides a double-pulse test system. The system is applied to the technical field of automatic testing. According to the system, two loop structures are adopted to perform interaction in testing, the two loop structures are interconnected through a state machine system, the first loop structure can be used for interacting with a user to obtain input data required by the testing, and the second loop structure can be used for interacting with test equipment to control the test equipment to test a tested piece and obtain test data returned by the test equipment, and carrying out real-time monitoring according to the test data. A control core of the double-pulse test system is formed based on a state machine system and the two loop structures, interaction in the testing is very convenient, the manual participation degree is reduced, intelligent recognition and control of automatic test are improved, and a large amount of accurate and reliable basic data can be provided for subsequent optimization design.
Description
technical field [0001] The invention relates to the technical field of automatic testing, in particular to a double-pulse testing system. Background technique [0002] With the rapid development of the new energy vehicle industry, as one of the core components of new energy vehicles, the motor driver (referred to as electric drive) has attracted more and more attention, and its reliability requirements are also extremely high, and in the actual use of electric vehicles , such as frequent acceleration, braking, etc., the working conditions of the motor are also very complicated. [0003] In existing schemes, the dual-pulse test method can usually be used to dynamically test the power module in the electric drive, and a large number of double-pulse tests can be performed on the electric drive in the vehicle scene to obtain the electric drive corresponding to the vehicle scene. Data under different working conditions in order to provide the basic data needed for optimal design...
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IPC IPC(8): G01R31/26G01R31/327
CPCG01R31/26G01R31/327
Inventor 夏雨昕杜禹侃冉力元强进王伟林昆鹏
Owner LEADRIVE TECH (SHANGHAI) CO LTD