Semiconductor high-voltage insulation test equipment

A high-voltage insulation and testing equipment technology, which is applied in the direction of electronic circuit testing, dielectric strength testing, optical testing flaws/defects, etc. It can solve the problems of increasing labor costs, inability to fully automate testing, and low testing efficiency, so as to reduce labor costs. , High test efficiency, avoiding the effect of accuracy
CN113671331AActive Publication Date: 2021-11-19无锡昌鼎电子有限公司
11 Cites 3 Cited by

Patent Information

Authority / Receiving Office
CN · China
Current Assignee / Owner
无锡昌鼎电子有限公司
Publication Date
2021-11-19

Smart Images

  • Figure 1
    Figure 1
  • Figure 2
    Figure 2
  • Figure 3
    Figure 3
Patent Text Reader

Abstract

The invention relates to the technical field of semiconductor production, in particular to semiconductor high-voltage insulation test equipment. The equipment comprises a substrate, a transverse plate, a supporting table, a waste box, an appearance detection assembly, a movable sorting assembly, a high-voltage test assembly, a placement assembly, two chip conveying frames and two portal frames, the two portal frames are symmetrically arranged on the top of the substrate, the two sides of the transverse plate are connected with the top ends of the two portal frames correspondingly, the appearance detection assembly is arranged at the top of the substrate, the movable sorting assembly is installed at the bottom of the transverse plate, the high-voltage testing assembly is arranged between the two portal frames, and the placing assembly is arranged beside the high-voltage testing assembly. According to the invention, high-voltage testing operation is carried out on the chips in a full-automatic manner, the testing efficiency is high, the chips are classified and stored in a full-automatic manner according to the testing result of whether electric leakage occurs, the influence of human errors on the testing accuracy is avoided, and the labor cost is also reduced.
Need to check novelty before this filing date? Find Prior Art

Description

technical field

[0001] The invention relates to the technical field of semiconductor production, in particular to semiconductor high-voltage insulation testing equipment. Background technique

[0002] A semiconductor refers to a material whose conductivity at room temperature is between that of a conductor and an insulator. Semiconductors are used in integrated circuits, consumer electronics, communication systems, photovoltaic power generation, lighting, high-power power conversion and other fields. For example, diodes are devices made of semiconductors. No matter from the perspective of technology or economic development, the importance of semiconductors is huge. The core units of most electronic products, such as computers, mobile phones or digital recorders, are closely related to semiconductors. Common semiconductor materials include silicon, germanium, gallium arsenide, etc., and silicon is the most influential one in the application of various semiconductor material...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More