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Parameter testing method and device of laser

A parametric test and laser technology, which is applied in the direction of optical instrument test, measuring device, machine/structural component test, etc., can solve the problems of affecting test efficiency and low efficiency, and achieve the effect of reducing test time and improving test efficiency

Inactive Publication Date: 2021-12-10
WUHAN PRECISE ELECTRONICS TECH
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  • Abstract
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  • Claims
  • Application Information

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Problems solved by technology

However, this method needs to measure the optical power of various points in multiple planes at different heights in order to find the point with the highest optical power, so the efficiency is very low, which seriously affects the test efficiency

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  • Parameter testing method and device of laser
  • Parameter testing method and device of laser
  • Parameter testing method and device of laser

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Embodiment Construction

[0044] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the drawings in the embodiments of the present invention. Apparently, the described embodiments are only some of the embodiments of the present invention, but not all of them. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative efforts fall within the protection scope of the present invention.

[0045] At present, when measuring the focal length of a laser, it is necessary to measure the optical power of each point in the horizontal plane of the laser beam emitted by the laser at different heights, in order to find the point with the highest optical power, and thus find the focus of the laser. This method is very inefficient and serious. affect test efficiency.

[0046] In view of this, if figure 2 As shown, the embodiment of the present invention provides a ...

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Abstract

The invention provides a parameter testing method and device for a laser, and the method comprises the steps: determining the rough range of a focal length through a larger rough searching step length in a preset focal length range according to the characteristic that the size of a light spot of a horizontal plane where a focus is located is minimum, and then determining the precise range of the focal length through a fine searching step length in the rough range of the focal length; therefore, the focus can be finally found without scanning each point in each plane, the test time of the focal length is greatly shortened, and the test efficiency is improved.

Description

technical field [0001] The invention relates to the field of laser testing, in particular to a laser parameter testing method and device. Background technique [0002] The traditional method of testing the focal length of a semiconductor laser (Laser Diode, LD), such as figure 1 As shown, among them, 1 is a semiconductor laser, 2 is an optical fiber, and 3 is a laser detector. The laser beam emitted by semiconductor laser 1 is coupled to the laser detector through optical fiber 2, usually through a manual coupling station or a self-coupling station. The laser beam emitted by the laser 1 is coupled through the optical fiber 2 and emitted through a focusing system (not shown in the figure). Utilizing the feature that the laser beam forms the smallest size spot at the focal position of the laser and reaches the maximum optical power, by scanning the optical power of each point in the horizontal plane of the laser beam emitted by the laser through optical fiber coupling at diff...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01M11/02
CPCG01M11/0257
Inventor 马超李博许德玉黄秋元周鹏
Owner WUHAN PRECISE ELECTRONICS TECH