A radio frequency chip testing device and method

Abstract

The invention relates to a radio frequency chip testing device and method. The radio frequency chip testing device includes: a testing machine and a plurality of sorting machines; the sorting machine is connected to the testing machine; the testing machine is embedded with a device for controlling the working mode of the sorting machine and the resource allocation of the testing machine Software program; the working modes of the sorting machine include: synchronous mode, roulette mode and asynchronous mode. The present invention can complete the testing of the working process of multiple sorting machines by using one testing machine, which can effectively solve the problem in the prior art that one testing machine can only control one sorting machine, thereby improving the testing efficiency and at the same time , reduce chip testing cost.

Description

technical field [0001] The invention relates to the field of radio frequency chip testing, in particular to a radio frequency chip testing device and method. Background technique [0002] With the continuous improvement of RF chip testing technology, factories have higher and higher requirements for mass production testing. Of course, people hope that the test efficiency can be continuously improved, but the existing domestic technology can only be set up for RF chip testing machines. The test machine corresponds to a sorting machine, which cannot meet the requirements of improving test efficiency. In this case, if the test efficiency is to be improved, it can only be achieved through external operations when the test speed is already very fast and there is no room for improvement. , the most notable is the increase in simultaneous operation of sorters. On the basis of other existing testing machines, if you want to improve efficiency, you can only buy another set of testin...

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Problems solved by technology

[0002] With the continuous improvement of RF chip testing technology, factories have higher and higher requirements for mass production testing. Of course, people hope that the test efficiency can be continuously improved, but the existing domestic technology can only be set up for RF chip testing machines. The test machine corresponds to a sorting machine, which cannot meet the requirements of improving test efficiency. In this case, if the test efficiency is to be improved, it can only be achieved through external operations when the test speed is already very fast and there is no room for improvement. , the most notable is the increase in simultaneous operation of sorters

On the basis of other existing testing machines, if you want to improve efficiency, you can only buy another set of testing machines and sorting machines. The speed can of course be increased by 50%, but obviously, the cost of testing machines and sorting machines has increased, and more It doesn't seem very wise to take up space

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