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Super-junction MOSFET (Metal-Oxide-Semiconductor Field Effect Transistor) with soft reverse recovery characteristic

A technology of reverse recovery and characteristics, applied in the direction of electrical components, circuits, semiconductor devices, etc., can solve problems such as high voltage overshoot, electromagnetic interference noise, etc., optimize di/dt and dv/dt, and improve reverse recovery The effect of the characteristic

Pending Publication Date: 2021-12-28
电子科技大学重庆微电子产业技术研究院
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

High di / dt and high dv / dt will lead to serious electromagnetic interference noise, coupled with the influence of parasitic inductance in the system, high di / dt will lead to high voltage overshoot, which will adversely affect the application system

Method used

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  • Super-junction MOSFET (Metal-Oxide-Semiconductor Field Effect Transistor) with soft reverse recovery characteristic
  • Super-junction MOSFET (Metal-Oxide-Semiconductor Field Effect Transistor) with soft reverse recovery characteristic
  • Super-junction MOSFET (Metal-Oxide-Semiconductor Field Effect Transistor) with soft reverse recovery characteristic

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Embodiment Construction

[0018] The present invention is described in detail below in conjunction with accompanying drawing

[0019] Such as figure 1 Shown is the super junction MOSFET with soft reverse recovery characteristics of the present invention. figure 2 For conventional super junction MOSFET. There is a body diode in the super junction MOSFET of the present invention and the conventional super junction MOSFET, its anode is composed of P+ short circuit region 9 / P type well region 7, and the cathode is composed of N+ drain region 2, and the drift region of the conventional MOSFET body diode is composed of P type drift Region 5 and N-type drift region 6, and the drift region of the super junction MOSFET of the present invention is composed of P-type drift region 5, N-type drift region 6, P-type buffer layer 3 and N-type buffer layer 4. The P-type buffer layer 3 introduced in the structure of the present invention extends the length of the drift region of the body diode.

[0020] It works as ...

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Abstract

The invention belongs to the technical field of power semiconductors, and particularly relates to a super-junction MOSFET (Metal-Oxide-Semiconductor Field Effect Transistor) with a soft reverse recovery characteristic. According to the device, the high-concentration P-type buffer layer is introduced into the super-junction structure of the voltage-resistant region, the length of a body diode drift region is prolonged by the introduced P-type buffer layer, so that the distribution of carriers in the drift region is closer to a drain electrode, the extraction of the carriers in the drift region is slowed down, and meanwhile, the highly-doped P-type buffer layer is not completely depleted when the device is withstand voltage, so that carriers in the highly-doped P-type buffer layer can be slowly extracted during reverse conduction, the drop rate di / dt of reverse recovery current is reduced, and the reverse recovery characteristic is improved. The super-junction MOSFET with the soft reverse recovery characteristic has the beneficial effects that di / dt and dv / dt during reverse recovery are optimized, so that the reverse recovery characteristic of the super junction MOSFET is improved.

Description

technical field [0001] The invention belongs to the technical field of power semiconductors, in particular to a super junction MOSFET (Metal-Oxide-Semiconductor Field-Effect Transistor, MOSFET for short) with soft reverse recovery characteristics. Background technique [0002] When super-junction MOSFETs are used in driving motor application circuits such as full bridges, their body diodes play a role in freewheeling. When the body diode conducts, a large number of hole carriers are stored in the drift region. In the process of switching the body diode from the conduction state to the withstand voltage state, the carriers stored in the body need to be discharged to form a large reverse current. Since the drift region of the super-junction MOSFET is completely exhausted at a lower voltage, the carriers in the drift region are discharged, so the di / dt and dv / dt of the body diode of the super-junction MOSFET are extremely large during reverse recovery, and the reverse recovery...

Claims

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Application Information

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IPC IPC(8): H01L29/78H01L29/06
CPCH01L29/7827H01L29/0634
Inventor 刘超夏云陈万军张波
Owner 电子科技大学重庆微电子产业技术研究院
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