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Chip automatic test system and chip test method

An automatic test system and chip technology, applied in electronic circuit testing, measuring electricity, measuring devices, etc., can solve problems such as low production efficiency and low degree of automation in the production of printing consumable chips

Pending Publication Date: 2022-01-07
HANGZHOU CHIPJET TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The purpose of the present invention is to provide an automatic chip testing system and a chip testing method to improve the problems of low automation and low production efficiency of printing consumable chips in the prior art

Method used

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  • Chip automatic test system and chip test method
  • Chip automatic test system and chip test method
  • Chip automatic test system and chip test method

Examples

Experimental program
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Effect test

Embodiment 1

[0063] Such as Figure 1-10 As shown, this embodiment provides an automatic chip test system, which includes a support 400 and a feeding unit 6 , a transfer unit 7 , at least one test unit 8 and a loading unit 9 arranged on the support 400 . Wherein, the feeding unit 6 includes a storage 61, a transporter 62 and a feeder 63; the storage 61 is used to store the first container 100, and the transporter 62 is used to take out the first container 100 in the storage 61 and transfer to At the feeding position, the feeder 63 transfers the chip 300 contained in the first container 100 at the feeding position to the transfer unit 7, and the transfer unit 7 transfers the chip 300 to the test unit 8, and the test unit 8 tests the chip 300 Operation, wherein the test operation includes writing and reading codes, and / or performance testing, and / or data rewriting, and / or marking operations. The loading unit 9 loads the chips 300 that have completed the testing operation into the second con...

Embodiment 2

[0105] combine Figure 14-15 As shown, the present embodiment also provides a chip testing method, which is applicable to the automatic chip testing system in any of the above-mentioned embodiments, and the chip testing method includes the following steps:

[0106] S01 , the feeding unit 6 transfers the first container 100 to the feeding position, and sends the chips 300 into the transfer unit 7 .

[0107] S02, the chip 300 is transmitted to one or more test units 8 by the transmission unit 7, and the test unit 8 performs performance detection and / or data writing and / or data verification and / or data rewriting and / or marking on the chip 300 operation; and at least one chip 300 can be stored in the test channel of each test unit 8; optionally, at least one chip 300 to be written and read can be stored in the test channel of each test unit 8; preferably, each test Five chips 300 to be written and read can be stored in the test channel of the unit 8 .

[0108] S03 : Detect the c...

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PUM

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Abstract

The invention relates to the technical field of chip production and particularly discloses an automatic chip testing system and a chip testing method. The automatic chip testing system comprises a feeding unit, a transmission unit, at least one testing unit and a loading unit, wherein the feeding unit is used for storing a first container and can transfer chips contained in the first container to the conveying unit, the conveying unit conveys chips to the testing unit, and the testing unit conducts testing operation on the chips; and the loading unit is used for loading the chip subjected to the test operation into a second container. According to the above arrangement, full-automatic production of chips is realized, and through arrangement of a plurality of test units, production by a single test unit or simultaneous production by a plurality of test units can be realized, so production efficiency is greatly improved, and production requirements of printing consumable chips are met.

Description

technical field [0001] The invention relates to the technical field of chip production and processing, in particular to a chip automatic testing system and a chip testing method. Background technique [0002] Most of the current printers use detachable printing consumables, and the printing consumables are provided with printing consumable chips. The common printing consumable chips include ink cartridge chips, toner cartridge chips and toner cartridge chips. During the process of loading the printing consumables into the printer, the printing consumable chip is used to communicate with the printer to complete the assembly of the printing consumables and the printer. [0003] Due to the large demand for printing consumable chips and mass production, the current production equipment has a low degree of automation and low production efficiency. Contents of the invention [0004] The object of the present invention is to provide an automatic chip testing system and a chip te...

Claims

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Application Information

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IPC IPC(8): G01R31/28G01R1/02
CPCG01R31/2867G01R1/02
Inventor 不公告发明人
Owner HANGZHOU CHIPJET TECH
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