Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

High-speed SAR ADC circuit

A circuit and high-speed technology, applied in the direction of electrical components, electrical signal transmission systems, signal transmission systems, etc., can solve the problems of slow speed, high power consumption of SARADC, etc., to alleviate the compromise problem, speed up the settling time, and increase the bias current Effect

Pending Publication Date: 2022-04-19
BRITE SEMICON SHANGHAI CORP
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] The successive approximation analog-to-digital converter has been widely used due to its low power consumption and low delay. However, due to the successive approximation, the SAR ADC with N bit resolution needs at least N conversion cycles, so the speed is slow
Although the SAR ADC with asynchronous timing has improved in speed, in the actual design, the total time of N conversion cycles varies greatly with the PVT (Process, Voltage, Temperature, process-voltage-temperature) corner (process angle), The speed is easily doubled under the fastest and slowest PVTCorner. In traditional design, the driving capability of the delay unit and the reference level drive circuit is set under the slowest Corner, so that Typical (standard process corner) and faster The reference level drive circuit of the corner is over-designed, resulting in a large power consumption of the SAR ADC

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • High-speed SAR ADC circuit
  • High-speed SAR ADC circuit
  • High-speed SAR ADC circuit

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0039] The present invention will be further described below in conjunction with accompanying drawing.

[0040] figure 2 It is a SAR ADC block diagram, mainly composed of a capacitor DAC (Digital to Analog converter, digital-to-analog converter) array, a comparator, a REF circuit (reference level drive circuit), a clock logic circuit, and a data logic circuit. The REF circuit is connected to the capacitor DAC array; the capacitor DAC array is connected to the two input terminals of the comparator; the comparator is connected to the clock logic circuit and the data logic circuit; the clock logic circuit outputs the comparator clock cmp_en to the comparator; the data logic circuit outputs the DAC The control signal DAC_CTL is given to the capacitor DAC array.

[0041] image 3 It is a timing block diagram of a 5-bit asynchronous SAR ADC as an example. In the sampling phase of the ADC, the sampling clock CKS is at a high level, and the capacitor DAC array samples the input si...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a high-speed SAR ADC circuit, which comprises a capacitor DAC array, a comparator, an REF circuit, a clock logic circuit and a data logic circuit, and is characterized in that the REF circuit is connected with the capacitor DAC array; the capacitor DAC array is connected with two input ends of the comparator; the comparator is connected with the clock logic circuit and the data logic circuit; the clock logic circuit outputs a comparator clock to the comparator; the data logic circuit outputs a DAC control signal to the capacitor DAC array; according to the data logic circuit, an additional M-bit DFF unit is added on the basis of an N-bit DFF unit, meanwhile, an additional M-bit data processing unit is added on the basis of an N-bit data processing unit, and both N and M are positive integers. According to the invention, by automatically adjusting the circuit delay and the current of the reference voltage circuit, the speed and the performance of the asynchronous SAR ADC can be kept stable under PVT, and the power consumption is reduced.

Description

technical field [0001] The present invention relates to successive approximation (SAR) analog-to-digital converters (ADCs). Background technique [0002] Successive approximation analog-to-digital converters have been widely used due to their low power consumption and low delay. However, due to the characteristics of successive approximation, SAR ADC with N bit resolution needs at least N conversion cycles, so the speed is relatively slow. Although the SAR ADC with asynchronous timing has improved in speed, in the actual design, the total time of N conversion cycles varies greatly with the PVT (Process, Voltage, Temperature, process-voltage-temperature) corner (process angle), The speed is easily doubled under the fastest and slowest PVTCorner. In traditional design, the driving capability of the delay unit and the reference level drive circuit is set under the slowest Corner, so that Typical (standard process corner) and faster The reference level driving circuit of the co...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H03M1/46
CPCH03M1/468
Inventor 林志伦岳庆华刘亚东庄志青
Owner BRITE SEMICON SHANGHAI CORP
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products