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High-precision laser measurement device and method

A laser measurement and high-precision technology, applied in the field of optoelectronics, can solve the problems of high equipment cost, single measurement range, and low precision, and achieve the effect of simple equipment, high measurement accuracy and low manufacturing cost

Pending Publication Date: 2022-04-22
PKU HKUST SHENZHEN HONGKONG INSTITUTION +1
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  • Application Information

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Problems solved by technology

[0005] The purpose of the present invention is to provide a high-precision laser measuring device and method to solve the problems of single measurement range, low precision and high equipment cost in the above-mentioned background technology

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  • High-precision laser measurement device and method
  • High-precision laser measurement device and method

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Embodiment Construction

[0031] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0032] see Figure 1-8, the present invention provides a technical solution: a high-precision laser measuring device, including a workbench 1, the four corners of the bottom of the workbench 1 are respectively equipped with supporting legs 11, which is beneficial to supporting equipment, and an atomic gas chamber is installed in the center of the top of the workbench 1 5. The atomic gas chamber 5 includes an airtight casing 501, a first transmission window 502...

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Abstract

The invention discloses a high-precision laser measurement device and method, and the device comprises a workbench, the center of the top of the workbench is provided with an atomic gas chamber, the two sides of the center of the workbench are provided with magnetic field systems, one side of the top of the workbench is fixedly connected with a temperature control system, and the two sides of the center of the top of the workbench are symmetrically provided with a first fixed rod and a second fixed rod. The atomic gas chamber is introduced to serve as a Faraday atom light filter to perform laser measurement, and the energy level splitting value of atoms in a magnetic field is changed by adjusting the size of the magnetic field, so that the atomic transition frequency is changed, and then the filtering frequency of the light filter is changed, that is, the frequency of the light filter is adjustable; under the condition that the filtering frequency of the optical filter under specific conditions is known, the laser frequency of the optical filter is also obtained through comparison, measurement of lasers with different frequencies is facilitated, meanwhile, the equipment and the method are high in measurement precision, the wavelength precision can reach 0.001 nm, and the equipment is simple and low in manufacturing cost.

Description

technical field [0001] The invention relates to the field of optoelectronic technology, in particular to a high-precision laser measuring device and method. Background technique [0002] Laser wavelength measurement is the core parameter of the laser. At present, the commonly used methods for laser wavelength measurement generally include interferometry, grating method, and absorption spectroscopy. Among them, the high precision of the interferometry requires more complicated equipment, and the usual spectrometer is used. Grating method, the laser wavelength is obtained through the diffraction of the grating. The advantage of the spectrometer is that it can measure a relatively wide wavelength range. Generally, spectrometers with high precision are more expensive, and most of them are imported, and the larger the wavelength range, the more expensive the price , although the small spectrometer is not too expensive but the accuracy is poor, it can only be used as a preliminary...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J9/00
CPCG01J9/00
Inventor 李春来马光金何进岳玉涛魏益群秦来香常鹏媛陈景标
Owner PKU HKUST SHENZHEN HONGKONG INSTITUTION
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