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Infrared filter for detecting refrigerant hfc-134a and its preparation method

A technology of infrared filters and refrigerants, applied in the direction of filters, optics, optical components, etc.

Active Publication Date: 2022-06-03
翼捷安全设备(昆山)有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] Infrared detection technology based on NDIR technology is a very reliable and cost-effective solution, but there is no infrared filter directly available on the market as the window of the detector

Method used

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  • Infrared filter for detecting refrigerant hfc-134a and its preparation method
  • Infrared filter for detecting refrigerant hfc-134a and its preparation method
  • Infrared filter for detecting refrigerant hfc-134a and its preparation method

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Embodiment Construction

[0044] In the infrared filter provided by the invention, the center wavelength is 8440nm, and the bandwidth is 210nm. Research in the present invention

[0049] In a preferred embodiment, the Sub base material may be an optical-grade monocrystalline silicon or monocrystalline germanium material,

[0050] Specifically, when the base material is composed of a single crystal silicon wafer, the main film system structure is:

[0051] Si / HLHL2HLHLHLHLH2LHL0.79H0.42L / Air,

[0053] Si / 0.28 (HL) ^ 70.40 (HL) ^ 70.55 (HL) ^ 70.73 (HL) ^ 71.43 (0.5LH0.5L) ^ 7 / Air;

[0057] Ge / 0.28 (HL) 70.40 (HL) 70.55 (HL) 70.73 (HL) 71.43 (0.5LH0.5L) 7 / Air.

[0060] (2) The substrate is baked at 180-220° C. and kept at a constant temperature for more than 120 minutes.

[0067] (7) Use a Fourier transform infrared spectrometer to measure the transmittance spectrum of the filter at normal incidence.

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Abstract

The present invention relates to an infrared filter for refrigerant HFC-134a detection and a preparation method thereof, wherein the infrared filter includes a base material, a main film structure and a cut-off film structure, and the main film The system structure and the cut-off film structure are respectively arranged on both sides of the base material; the main film structure is Sub / HLHL2HLHLHLHLH2LHL0.79H0.42L / Air; the cut-off film structure is: Sub / 0.28( HL)^7 0.40(HL)^7 0.55(HL)^7 0.73(HL)^7 1.43(0.5LH0.5L)^7 / Air. The infrared filter used for refrigerant HFC-134a detection of the present invention has a center wavelength of 8440nm, is specially used for HFC-134a gas detection, and fills up the gap in the market.

Description

Infrared filter for detection of refrigerant HFC-134a and preparation method thereof technical field The present invention relates to air-conditioning refrigerant detection field, relate in particular to the technical field of infrared filters, specifically refer to a kind of Infrared filter for detection of refrigerant HFC-134a and preparation method thereof. Background technique [0002] 1,1,1,2-tetrafluoroethane (HFC-134a) is used after CFCs (chlorofluorocarbons, such as chlorofluorocarbons) substances are banned One of the most widely used refrigerants, especially in the field of automotive air conditioning refrigerants, it occupies an absolute dominant position. Although HFC‑ 134a Ozone Depletion Potential (ODP) is zero, but its Global Warming Potential (GWP) is high, so it is included in the Kyoto Protocol. Listed as a fluorine-containing greenhouse gas that should be controlled. This requires us to strictly control the use of HFC‑134a as a refrigerant its le...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G02B5/20C23C14/58C23C14/30C23C14/26C23C14/16C23C14/06C23C14/02
CPCG02B5/208C23C14/30C23C14/26C23C14/16C23C14/0629C23C14/5806C23C14/022
Inventor 何虎张杰许晴张敏敏于海洋
Owner 翼捷安全设备(昆山)有限公司
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