Electronic product comprehensive stress dust test evaluation method

Abstract

The invention discloses an electronic product comprehensive stress dust test evaluation method, and belongs to the field of reliability test. The method comprises the following steps: firstly, carrying out investigation and information collection on an actual application environment of a to-be-evaluated electronic product, and carrying out classified statistical analysis on related data; secondly, according to a data analysis result in the first step, comprehensive stress sand and dust test severity selection and test profile design are carried out; then, according to the test conditions and the profile designed in the step 2, specific implementation of the test and monitoring of key parameters are carried out; and finally, carrying out performance characterization test and risk grade judgment on the test sample. Based on the actual application environment characteristics of the product, the temperature stress and sand dust comprehensive stress condition is introduced, and the risk grade of the product is evaluated under the temperature and humidity conditions, so that the application environment of the product can be simulated more appropriately, and the reliability of the electronic product under the comprehensive sand dust stress condition is evaluated more perfectly.

Description

technical field [0001] The invention relates to the technical field of reliability testing, in particular to an electronic product comprehensive stress dust test evaluation method. Background technique [0002] With the continuous development of the level of industrialization and the continuous deterioration of the natural environment, the dust environment has further increased the impact on the service life and reliability of electronic products. The intrusion of sand and dust may cause electronic products to have harmful effects such as stuck moving parts, abrasive moving parts, changes in contact resistance and insulation properties, reduced thermal conductivity, increased noise, lubricant contamination, and changes in optical properties. [0003] Sand and dust intrusion into electronic products is due to the deposition of its own gravity, the introduction of air thermal movement, and the inhalation caused by inconsistent air pressure due to temperature changes. Generall...

AI Technical Summary

Problems solved by technology

Generally, dust deposited on the surface of an insulator is a poor conductor; however, when combined with other environments such as temperature and humidity, it will dissolve soluble particles to form an electrolyte, thereby accelerating the corrosion of metal corrosion and the change of electrical conductivity

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