Microchannel plate collection efficiency test system and test method

A microchannel plate, collection efficiency technology, applied in the field of microchannels

Pending Publication Date: 2022-05-13
东莞市中科原子精密制造科技有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] The purpose of the present invention is to provide a micro-channel plate collection efficiency testing system and testing method for solving the problem in the prior art that the collection efficiency of the micro-channel plate can only be calculated by simulation

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  • Microchannel plate collection efficiency test system and test method
  • Microchannel plate collection efficiency test system and test method
  • Microchannel plate collection efficiency test system and test method

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Embodiment Construction

[0043] Reference will now be made in detail to the exemplary embodiments, examples of which are illustrated in the accompanying drawings. When the following description refers to the accompanying drawings, the same numerals in different drawings refer to the same or similar elements unless otherwise indicated. The implementations described in the following exemplary examples do not represent all implementations consistent with the present disclosure. Rather, they are merely examples of systems and methods consistent with aspects of the present disclosure as recited in the appended claims.

[0044] figure 1 Shown is the structural representation of a kind of microchannel plate collection efficiency test system provided by the present invention, as figure 1 As shown in , the system includes: a pulse power supply 1 , a light source 2 , a photocathode 3 , an output charge spectrum test system, a vacuum chamber 6 , and a DC high voltage power supply 9 . Wherein, the power input ...

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Abstract

The invention relates to a microchannel plate collection efficiency test system and test method. The test system comprises a pulse power supply, a light source, a photoelectric cathode, an output charge spectrum test system, a vacuum cavity and a direct-current high-voltage power supply, the pulse power supply drives the light source to emit light to irradiate the photoelectric cathode; the output charge spectrum testing system comprises an anode and a computer, the photoelectric cathode and the anode are arranged in the vacuum cavity, and the computer is arranged on the outer side of the vacuum cavity; the direct-current high-voltage power supply is electrically connected with the photoelectric cathode, the anode and a to-be-tested micro-channel plate arranged between the photoelectric cathode and the anode so as to provide working voltage; and the output charge spectrum test system collects the electrons which are multiplied and emitted by the micro-channel plate through the anode to obtain a second output pulse, and calculates the collection efficiency of the to-be-tested micro-channel plate according to the first output pulse of the pulse power supply and the second output pulse. According to the invention, the collection efficiency of the microchannel plate can be tested through experiments.

Description

technical field [0001] The disclosure relates to the technical field of microchannels, in particular to a collection efficiency testing system and testing method of a microchannel plate. Background technique [0002] The microchannel plate is a two-dimensional channel type continuous dynode electron multiplier device, which simultaneously has the ability to detect electrons, ions, ultraviolet photons and soft X-rays, as well as the sub-nanosecond time resolution ability. It is made up of millions of microchannels with a diameter of a few micrometers. When the particles are incident on the inner wall of the microchannel, primary secondary electrons will be generated. If a certain voltage is applied to both ends of the channel, the generated primary secondary electrons will accelerate under the action of the electric field, and after multiple collisions with the channel wall and electron multiplication process, and finally generate a large number of electrons at the output en...

Claims

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Application Information

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IPC IPC(8): G01R31/25
CPCG01R31/252
Inventor 李相鑫
Owner 东莞市中科原子精密制造科技有限公司
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