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Monochromatic transmission light intensity calibration nondestructive testing method and equipment for SERS (Surface Enhanced Raman Scattering) Raman chip sensitivity

A Raman chip, transmitted light technology, applied in the measurement of color/spectral characteristics, Raman scattering, transmittance measurement, etc. Very clean and so on

Pending Publication Date: 2022-07-15
大连世佩达光谱智能检测科技有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Due to the high sensitivity of the Raman chip, it is difficult to clean very clean after using the detection once, and it is impossible to do the second ultra-sensitive detection multiplexing
Therefore, during the "factory quality inspection" of the Raman chip products, "sampling inspection" can only be carried out in the same batch of products, and there is no non-destructive testing method for the sensitivity of SERS Raman chips.

Method used

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  • Monochromatic transmission light intensity calibration nondestructive testing method and equipment for SERS (Surface Enhanced Raman Scattering) Raman chip sensitivity
  • Monochromatic transmission light intensity calibration nondestructive testing method and equipment for SERS (Surface Enhanced Raman Scattering) Raman chip sensitivity
  • Monochromatic transmission light intensity calibration nondestructive testing method and equipment for SERS (Surface Enhanced Raman Scattering) Raman chip sensitivity

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0045] The non-destructive quality inspection method of the no-load SERS Raman chip through light intensity calibration in the air environment includes the following specific steps:

[0046] The first step, press H SP ~H RS The calibration method requires the configuration of H dedicated to the Raman chip SP A deep-cooled CCD Raman spectrometer for non-destructive quality inspection, and a standard Raman spectrum standard sample for non-destructive quality inspection and standard concentration-R6g-10 -6 M / L;

[0047] The second step, for H SP To calibrate non-destructive quality inspection equipment, it is necessary to purchase three components: halogen tungsten light source, high-sensitivity spectrometer and notebook computer, such as figure 2 shown, design discrete or integrated manufacturing into H SP Calibration of special equipment for non-destructive quality inspection;

[0048] The third step, on the production line of the Raman chip, selects the Raman chip used ...

Embodiment 2

[0055] The non-destructive quality inspection method of SERS Raman chip monochromatic transmission light intensity calibration under the environment of silver nitrate solution as sample and medium includes the following specific steps:

[0056] The first step, press H SP ~H RS The calibration method requires that the configuration is dedicated to the H of the Raman chip SP Deep-cooled CCD Raman spectrometer for calibration of nondestructive quality inspection, and standard Raman spectrum standard sample of standard concentration for nondestructive quality inspection calibration - such as R6g-10 -6 M / L;

[0057] The second step, for H SP To calibrate the non-destructive quality inspection equipment, it is necessary to purchase three components, such as a UV-Vis broadband light source, a high-sensitivity spectrometer and a laptop computer, such as figure 2 shown, design discrete or integrated manufacturing into H SP Calibration of special equipment for non-destructive qual...

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Abstract

The invention relates to an SERS (Surface Enhanced Raman Scattering) Raman chip monochromatic transmission light intensity calibration nondestructive quality inspection method and equipment, and the method is an HSP-HRS calibration nondestructive quality inspection technology adopting monochromatic source transmission light intensity (HSP) to indirectly characterize Raman peak height (HRS) of a calibration sample: 1, selecting a group of calibration Raman chips with different sensitivities, and in an extinction transmission spectrum curve of an ultraviolet visible light source, selecting a group of calibration Raman chips with different sensitivities; finding out an extinction spectrum, namely an SPR main peak position, an SPR secondary peak position and other peak positions which are sensitive to the SPR effect and are suitable for monochromatic light; or finding out the three types of peak positions through numerical simulation; 2, preferably selecting one of the three types of peak positions, and successively detecting HSP and HRS of a monochromatic light source of the calibration Raman chip set; 3, creating a ''HSP-HRS'' calibration curve; and 4, implementing nondestructive testing on the Raman chip on the monochromatic transmission light intensity HSP-HRS calibration equipment, so as to solve the problem of nondestructive testing of the sensitivity quality of the SERS Raman chip.

Description

technical field [0001] The invention relates to the field of Raman spectrum chips, in particular to a non-destructive testing method and equipment for SERS Raman chip sensitivity calibration with monochromatic transmitted light intensity. Background technique [0002] At present, the sensitivity and quality detection of SERS Raman chip (Raman chip or RS chip for short) relies on selecting a sample with relatively high Raman activity, such as using R6g aqueous solution with a concentration of micro and nano M / L as the standard sample. It is placed on the Raman chip, placed on the sample stage of the deep cooling-CCD Raman spectrometer, and the Raman spectrum of the R6g molecule is detected, which is used as a reference standard for evaluating the sensitivity and quality of the Raman chip. Because the Raman chip has high sensitivity, and after one use and detection, it is difficult to clean and very clean, and the second ultra-sensitive detection and multiplexing cannot be per...

Claims

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Application Information

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IPC IPC(8): G01N21/65G01N21/33G01N21/59
CPCG01N21/658G01N21/33G01N21/59
Inventor 吴世法邸琨
Owner 大连世佩达光谱智能检测科技有限公司