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High-definition direct-reading spectrum observation instrument

An observer and spectrum technology, applied in the field of spectrum observation, can solve problems such as inability to read directly, complex structure and operation technology of the spectrum observer, and achieve the effect of fast measurement speed, simple and intuitive structure design, and no need for debugging

Inactive Publication Date: 2022-07-22
JILIN JIANZHU UNIVERSITY +1
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Problems solved by technology

[0012] The purpose of the present invention is to provide a high-definition direct-reading spectral observation instrument for the observation technical defects of various existing spectral observation devices. The high-definition direct-reading spectrum observer can realize high-definition display of spectral line distribution without other supporting equipment, quickly directly read the spectral line wavelength value, and has the function of dynamically observing spectral line distribution

Method used

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  • High-definition direct-reading spectrum observation instrument
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Embodiment Construction

[0032] In order to make the objects, features and advantages of the present invention more obvious and understandable, the technical solutions in the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the present invention is not limited by the following examples, and specific implementations can be determined according to the technical solutions and actual conditions of the present invention.

[0033] like figure 1 , figure 2 , image 3 , Figure 4 , Figure 5 , Image 6 , Figure 7 , Figure 8 , Figure 9 and Figure 10 As shown, the high-definition direct-reading spectrometer includes: an instrument housing 1 , a grating 2 , a convex lens 3 , a wavelength reading scale 4 , an adjustable slit 5 , a ground glass sheet 6 and a positioning plate 7 . The following is a description of the selection specifications and installation positions of each component:...

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Abstract

A high-definition direct-reading spectrum observation instrument belongs to the field of spectrum observation and comprises an instrument shell, a grating, a convex lens, a wavelength reading scale, an adjustable slit, a ground glass sheet and a positioning flat plate, according to the spectrum observation instrument, scattered light emitted by the to-be-measured light source is converged by the convex lens, then is projected on the grating, is diffracted by the grating, then is emitted and enters eyes of an observer or a lens of a shooting device, and a spectral line distribution image observed by the eyes or the shooting device is just located on the plane where the wavelength reading scale is located. And the corresponding wavelength value can be obtained by aligning with the scale of the wavelength reading scale for reading. The spectrum observation instrument has the advantages of simpler and more visual structure, convenience and quickness in experimental operation, clear and definite spectral line imaging, high measurement speed, capability of directly reading wavelength numerical values, small random error, high measurement accuracy enough to deal with different measurement of various light sources, visual phenomenon, no need of debugging, no need of a darkroom environment, wide double-eye observation field of view, high measurement accuracy and high measurement precision. And the distribution state of all spectral lines can be observed.

Description

technical field [0001] The invention belongs to the field of spectrum observation, and more particularly relates to a high-definition direct-reading spectrum observer. Background technique [0002] The experimental purpose of the grating diffraction experiment is to observe the diffraction phenomenon of the grating, understand the application and characteristics of the grating, and measure the wavelengths of various spectral lines contained in the light source. The main supporting instrument used is a spectrometer, and the main theoretical formula used is the grating equation: d ·sinθ=K·λ, K is set to 1, as long as the diffraction angle θ is measured, the wavelength λ can be calculated. Although the principle of using a spectrometer for measurement is simple, the adjustment and preparation of the instrument before observation is complicated. If there is not enough formal training, It will seriously affect the measurement accuracy and even cause errors. It is necessary to rep...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J3/30G01J3/28G01J3/02G01J3/18
CPCG01J3/30G01J3/2823G01J3/0259G01J3/0291G01J3/18
Inventor 邓宇蔺勤富艾淑平郭亮张晶莹申芳芳沈璐王欢
Owner JILIN JIANZHU UNIVERSITY
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