Multi-channel test control equipment and automatic multi-channel test system and method

A test control and multi-channel technology, applied in the direction of measuring devices, measuring electrical variables, measuring resistance/reactance/impedance, etc., can solve the problems of large space occupation, large number of uses, low test efficiency and production efficiency, and reduce costs cost, reduction in the number of uses, and the effect of improving test efficiency and production efficiency

Pending Publication Date: 2022-07-29
LUXSAN PRECISION ITECH (KUNSHAN) CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] The embodiment of the present application provides a multi-channel test control device, an automated multi-channel test system and method, which can solve the problem of using a large number of related equipment and occupying a large space

Method used

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  • Multi-channel test control equipment and automatic multi-channel test system and method
  • Multi-channel test control equipment and automatic multi-channel test system and method
  • Multi-channel test control equipment and automatic multi-channel test system and method

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Example Embodiment

[0017] Embodiments of the present invention will be described below with reference to the relevant drawings. In the figures, the same reference numbers refer to the same or similar components or method flows.

[0018] It must be understood that words such as "comprising" and "comprising" used in this specification are used to indicate the existence of specific technical features, values, method steps, operation processes and / or components, but do not exclude the possibility of adding Further technical features, values, method steps, job processes, components, or any combination of the above.

[0019] It must be understood that when an element is described as being "connected" or "coupled" to another element, it can be directly connected or coupled to the other element, and intervening elements may be present. In contrast, when a component is described as being "directly connected" or "directly coupled" to another component, there are no intervening components present.

[002...

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Abstract

The invention discloses a multi-channel test control device, an automatic multi-channel test system and an automatic multi-channel test method. The multi-channel test control device comprises an LCR connector connected with the LCR tester, a DCR connector connected with the DCR tester, a switching module, a plurality of channel output modules and a processing module. The processing module controls the switching module to be connected with the LCR connector or the DCR connector based on different control instructions sent by the computer device, and transmits corresponding confirmation information to the computer device after controlling the channel output modules corresponding to the different control instructions to be connected or disconnected with the corresponding to-be-tested products; and the computer device controls the LCR tester or the DCR tester to test the to-be-tested product in conduction connection with the channel output module through the switching module based on different control instructions and corresponding confirmation information. Therefore, the LCR test and the DCR test are integrated into one work station, and multi-channel test is realized.

Description

technical field [0001] The present application relates to the technical field of electronic component testing, and in particular, to a multi-channel test control device, an automated multi-channel test system and method. Background technique [0002] After industrial production of electronic components, it is necessary to use a special test device to test them to determine whether the electronic components are abnormal. For example, an LCR tester is used to measure the corresponding physical parameters of capacitance, resistance and inductance components, and a DCR tester is used to measure the direct current resistance (DCR) of electronic components. [0003] In the process of testing electronic components, different test stations need to be set up for different special test devices, and there are problems that the related equipment is used in large quantities and occupies a large space. In addition, the existing LCR test program and DCR test program are manually operated ...

Claims

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Application Information

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IPC IPC(8): G01R27/02G01R27/26G01R1/20
CPCG01R27/02G01R27/26G01R27/2605G01R1/206
Inventor 王扣成梁飞云满洋赵志强朱玲
Owner LUXSAN PRECISION ITECH (KUNSHAN) CO LTD
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