Reliability evaluation method considering influence of multi-stress coupling effect on product degradation
A multi-stress and reliability technology, applied in the direction of design optimization/simulation, instruments, complex mathematical operations, etc., can solve the problems of inaccurate reliability evaluation results, and the joint influence of degradation rate-degradation fluctuations due to multi-stress coupling effects, etc. , to achieve the effect of enhancing flexibility and applicability and improving evaluation accuracy
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[0061] The embodiment takes the multi-stress accelerated degradation test data of a certain type of film capacitor as an example to complete the reliability evaluation considering the combined effect of multi-stress coupling on the degradation rate and degradation fluctuation of the film capacitor. The specific steps are as follows:
[0062] Step 1: Determine the amount and type of accelerated stress applied in the multi-stress accelerated degradation test of a certain type of film capacitor S = {S 1 ,S 2 ,S 3 }, S 1 represents the temperature stress, S 2 represents the voltage stress, S 3 represents the vibration stress.
[0063] Step 2: Establish a performance parameter degradation model considering the film capacitor degradation rate-degradation fluctuation correlation, as shown in formula (1).
[0064] Step 3: Establish the quantitative relationship of the effect of temperature, voltage and vibration stress coupling on the degradation rate of the film capacitor, as sh...
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