Device and method for calibrating wavelength of X-ray spherical curved crystal spectrometer
A technology of spherical bending and crystal spectrometer, which is applied in the direction of measuring devices, radiation measurement, material analysis using wave/particle radiation, etc., can solve the problems of weak spectral line intensity and inaccurate wavelength calibration method of curved crystal spectrometer, etc. To achieve the effect of avoiding the intensity of the spectral line from being too weak
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[0032] The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, but not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.
[0033] refer to figure 1 , figure 2 , the device for wavelength calibration of an X-ray spherical curved crystal spectrometer provided by the embodiment of the present invention includes a vacuum chamber 1 and a double crystal 6, a detector 7, a beryllium window 8 and an X-ray chamber arranged in the vacuum chamber 1 A ray source 5, the X-ray source 5 includes a titanium-X-ray source 51 and a cadmium-X-ray source 52, the X-ray sourc...
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