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Device and method for calibrating wavelength of X-ray spherical curved crystal spectrometer

A technology of spherical bending and crystal spectrometer, which is applied in the direction of measuring devices, radiation measurement, material analysis using wave/particle radiation, etc., can solve the problems of weak spectral line intensity and inaccurate wavelength calibration method of curved crystal spectrometer, etc. To achieve the effect of avoiding the intensity of the spectral line from being too weak

Inactive Publication Date: 2022-08-05
HEFEI INSTITUTES OF PHYSICAL SCIENCE - CHINESE ACAD OF SCI
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Problems solved by technology

[0006] The present invention provides a device and method for wavelength calibration of X-ray spherical curved crystal spectrometers, so as to solve the technical problems in the prior art that the wavelength calibration method of curved crystal spectrometers is not accurate enough or the spectral line intensity is too weak

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  • Device and method for calibrating wavelength of X-ray spherical curved crystal spectrometer
  • Device and method for calibrating wavelength of X-ray spherical curved crystal spectrometer

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[0032] The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, but not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

[0033] refer to figure 1 , figure 2 , the device for wavelength calibration of an X-ray spherical curved crystal spectrometer provided by the embodiment of the present invention includes a vacuum chamber 1 and a double crystal 6, a detector 7, a beryllium window 8 and an X-ray chamber arranged in the vacuum chamber 1 A ray source 5, the X-ray source 5 includes a titanium-X-ray source 51 and a cadmium-X-ray source 52, the X-ray sourc...

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Abstract

The invention discloses a device and a method for calibrating the wavelength of an X-ray spherical curved crystal spectrometer, the device comprises a vacuum chamber, and a bicrystal, a detector, a beryllium window and an X-ray source which are arranged in the vacuum chamber, the X-ray source comprises a titanium-X-ray source and a cadmium-X-ray source, and the X-ray source is arranged between the bicrystal and the beryllium window; the bicrystal is arranged at the bottom of the vacuum chamber, one side of the vacuum chamber is communicated with a first chamber, the detector is arranged on the side, away from the vacuum chamber, of the first chamber, and the detector and the bicrystal are oppositely arranged; the vacuum chamber is provided with a high-voltage feed-through for configuring a high-voltage loop; a movement mechanism is arranged on the vacuum chamber, the X-ray source is connected with the movement mechanism, and the movement mechanism is used for controlling movement of the X-ray source so that the center of the X-ray source and the center of the bicrystal can be located at the same horizontal height. According to the invention, the X-ray source is arranged in the vacuum chamber, so that the calibration source is ensured to be static, and the intensity of the calibration spectral line is prevented from being too weak.

Description

technical field [0001] The invention relates to the field of wavelength calibration of spherical curved crystal spectrometers used in tokamak devices, in particular to a device and method for wavelength calibration of X-ray spherical curved crystal spectrometers. Background technique [0002] X-ray spherical curved crystal spectrometer (abbreviated as curved crystal spectrometer) is one of the main diagnostics for measuring plasma ion temperature and rotational speed on tokamak devices. Its principle is mainly based on the Doppler translation of identified spectral lines. That is, the identification spectral line emitted by the plasma with a certain rotational speed will have a certain translation (Doppler translation) in wavelength relative to the spectral line emitted when it is stationary. This amount of translation is proportional to the component of the rotational speed in the direction of the line of sight. However, in order to obtain the absolute value of the plasma ...

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Application Information

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IPC IPC(8): G01T7/00G01N23/00G21B1/23
CPCG01T7/005G01N23/00G21B1/23Y02E30/10
Inventor 王福地卢迪安盛鹏金亿飞符佳张洪明吕波
Owner HEFEI INSTITUTES OF PHYSICAL SCIENCE - CHINESE ACAD OF SCI
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