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Film removing apparatus, film removing method and substrate processing system

A substrate processing system and substrate technology, applied in the direction of cleaning methods and tools, pretreatment surfaces, chemical instruments and methods, etc., can solve the problems of complex processing procedures, insufficient prevention of substrate contamination, and inability to discharge, so as to achieve shortened processing time, The effect of shortening the transfer time and preventing damage to the board

Inactive Publication Date: 2007-04-25
TOKYO ELECTRON LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, even with such a microfabrication device, it is still impossible to eliminate the possibility that the decomposed products of the film once removed will adhere to it again.
Still not enough to prevent contamination of the substrate
In addition, since the entire substrate is stained with liquid, post-processing requires a cleaning mechanism to clean the entire substrate, so there is a disadvantage that the processing process is complicated.

Method used

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  • Film removing apparatus, film removing method and substrate processing system
  • Film removing apparatus, film removing method and substrate processing system
  • Film removing apparatus, film removing method and substrate processing system

Examples

Experimental program
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Embodiment approach

[0215]In this embodiment, although the film removing device 122 is arranged on the back side of the processing area 121, it may be installed on another side as long as it is accessible by the main conveying device 126 . The interface part 124 can also be provided on other side surfaces of the processing area 121 in the same way. In addition, in the processing area 121, a buffer cassette for temporarily storing the wafer W before being transported by the film removing device 112 may be provided.

[0216] Although the above-mentioned embodiment is a form which removes an antireflection film, this invention is also applicable to the case where an antireflection film and a protective film are removed simultaneously, for example. In addition, the present invention is also applicable to cases where other films are removed. It should be noted that the contents and order of processing other than the above-mentioned film removal processing can be freely changed in accordance with the ...

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Abstract

A film removing device, comprising a substrate holding part (60) for holding a substrate having coated film, a laser beam source (63) for partially peeling off the coated film from the substrate by locally radiating laser beam at an alignment mark position (14) on the substrate placed on the substrate holding part, a fluid feed mechanism (113 to 116, 201, 202) having main nozzles (64, 172, 200) for feeding specified fluid to the alignment mark position, a collecting mechanism (90) having sucking ports (66a, 171, 193) for sucking, on the substrate, the specified fluid fed to the alignment mark position together with peeled film components, and guide members (65, 170, 191) for guiding the specified fluid jetted from the main nozzles to the alignment mark position and guiding the fluid to the sucking ports of the collecting mechanism so that the specified fluid and peeled film components do not diffuse nor leak to the periphery of the alignment mark position.

Description

technical field [0001] The present invention relates to a film removing device, a film removing method, and a substrate processing system for removing a coating film such as a protective film and an antireflection film from a positioning mark for substrate positioning. Background technique [0002] The photolithography process (Photolithography process) for manufacturing LCD or semiconductor devices is carried out in the following order: a protective film coating process for coating a protective liquid on the surface of a substrate (glass substrate for LCD, semiconductor wafer), and forming a specified surface on the protective film. The exposure treatment of the latent image pattern and the development treatment of developing the protective film. Thus, a prescribed circuit pattern is formed on the substrate. [0003] In terms of exposure processing, the exposure machine must position the substrate with high precision. The steps of substrate positioning are as follows: make...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L21/027B05C5/00B05C11/10B05D3/00B08B7/00B23K26/08B23K26/14H01L21/00H01L23/544
CPCB23K26/147B23K26/0853H01L21/6838H01L23/544H01L21/67051H01L21/67259B08B7/0042H01L21/6708H01L21/67057B23K26/1417H01L21/681B23K26/146H01L2924/0002H01L2924/00G03F7/30G03F7/422H01L21/6704
Inventor 寺田正一吉高直人饱本正巳
Owner TOKYO ELECTRON LTD