Declining lug structure on surface of reflector and its mfg method
A manufacturing method and technology of reflecting mirror surface, which can be applied to photosensitive materials, nonlinear optics, instruments, etc. for opto-mechanical equipment, and can solve the problems of increasing manufacturing cost, time-consuming, complicated and time-consuming processes, etc.
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Embodiment 1
[0040] In this embodiment, a photomask with slits is used to form the inclined bump structure on the mirror surface of the present invention. Wherein, the photomask includes m groups of patterns, and each group of patterns is composed of n strips of different widths arranged with a gap from wide to narrow, and at least one is added between each gap. The narrow strips form multi-slits on the photomask. Wherein, m is a positive integer ≥1, and n is a positive integer ≥2.
[0041] refer to Figure 4 , which shows a partial top view of a photomask according to Embodiment 1 of the present invention. The photomask 400 includes m groups of patterns, and each group of patterns consists of n strips (401) 1 , (401) 2 , (401) 3 、...(401) n Composition, and its width is W respectively 1 , W 2 , W 3 ,...,W n . The gap between the strips is d in sequence 1 、d 2 、d 3 ,...,d n , and take a narrow strip in the gap as an example, the width of the narrow strip is s 1 , s 2 , s ...
Embodiment 2
[0051] In the second embodiment, another photomask pattern with slits is provided for the manufacturing of the present invention to obtain the inclined bump structure. After fabrication, the photoresist of Example 2 has a higher degree of bump aggregation than that of Example 1, that is, the degree of concavo-convexity on the reflective mirror surface is improved, and the light scattering effect is better.
[0052] The photomask of the second embodiment includes m groups of patterns (m is a positive integer ≥ 1), and each group of patterns consists of a plurality of strips arranged from wide to narrow, and the gaps between the strips Also take a narrow strip as an example. The m groups of patterns can be randomly arranged on the photomask, or they can be arranged neatly like a matrix, for example, m' groups of long sides and n' groups of wide sides (m=m'×n'). In this embodiment, for the convenience of description, m groups of figures are randomly arranged, and each set of fig...
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