Femto second heavy current high brightness electron microscope device

An electron microscope, strong current technology, applied in circuits, discharge tubes, electrical components, etc., can solve problems affecting development and achieve the effect of reducing requirements

Inactive Publication Date: 2003-10-15
SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] It is a pity that the current electron microscope can only work in a continuous manner, and can only be used to study and observe some static problems. In a sense, this seriously affects its development

Method used

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  • Femto second heavy current high brightness electron microscope device
  • Femto second heavy current high brightness electron microscope device

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Embodiment Construction

[0021] Femtosecond strong current high brightness electron microscope device of the present invention such as figure 1 shown. It includes a femtosecond Nd:YAG laser 1 placed in the atmosphere, a filter 2 and an achromatic lens 3, a photocathode 4 placed in a vacuum envelope, an accelerating anode 5, an electromagnetic magnifying lens group 6, and a receiver fluorescent screen 7.

[0022] Femtosecond Nd: YAG laser 1 is a frequency-doubled laser with a pulse width of 500 femtoseconds and an output energy of 50nj. It is composed of an oscillator and an amplifier. 2 is completed, incident on the achromatic lens 3, focused by it, and incident on the photocathode 4 to generate photoelectrons, the energy bandwidth of photoelectrons is:

[0023] ΔE=1 / 2(E L -φ)

[0024] In the formula, E L is the laser photon energy, and φ is the work function of the photocathode. After the photoelectron is accelerated by the accelerating anode 5, it is amplified by the ...

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Abstract

The femto-second powerful current high brightness electronic microscope plant consists of two parts, the first part includes femto-second laser, optical filter and lens combination; and the second part includes one vacuum casing and inside optical cathode, accelerating cathode, electromagnetic lens and acceptor fluorescent screen. The femto-second laser is one Nd:YAG double-frequency laser, the optical filter is used in regulating the output power density of the femto-second laser, the lens combination is a achromatic one, and the optical cathode is made of metal compound LaB6. The plant may operate in continuous state or high-repeated frequency femto-second supershort pulse state for observing various superfast courses.

Description

Technical field: [0001] The invention relates to a pulse electron microscope device, in particular to a femtosecond high-current high-brightness electron microscope. Background technique: [0002] Electron microscopes have been widely used in the microscopic field and have become a well-known industry. They have also become an indispensable tool in hospitals, industrial and agricultural production departments, national defense, universities, research institutes and other units. [0003] It is a pity that the current electron microscope can only work in a continuous manner, and can only be used to study and observe some static problems. In a sense, this seriously affects its development. Invention content: [0004] The present invention aims at the shortcoming of above-mentioned prior art, proposes a kind of adopting femtosecond strong laser pulse to drive photocathode to equip electron microscope, laser drives photocathode is based on the principle of photoelectric effect,...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01J37/26
Inventor 陈建文高鸿奕谢红兰李儒新徐至展
Owner SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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