Time delayed testing generation method for wire-to-wire crosstalk decereration effect

Abstract

The method includes steps: collecting source of cross talk between lines; selecting faults and reducing fault set; carrying out time delay test generation for reduced fault set. Specific test of time delay is needed to carry out for degressive performance caused by retardation effect of cross talk between lines. The steps are as following: (1) obtaining circuit delay assignment and critical path; (2) preprocessing jump signal; (3) collecting source of cross talk in critical path; (4) enhancing sub path sensitized time delay test generation and reduction of testing set.

Description

technical field [0001] The invention relates to the technical field of semiconductor technology, in particular to a delay test generation method for crosstalk deceleration effect between lines, which is to generate time delay test for the performance degradation caused by crosstalk deceleration effect between lines, effectively simplifying fault sets, and improving test performance. Latency test generation method for generation efficiency and reduced test cost. Background technique [0002] The increasingly refined semiconductor technology makes the transistor size smaller and smaller, so the signal transition edge of the device is faster and faster, which leads to increasingly serious signal integrity problems in the field of high-speed digital circuit system design. Signal integrity refers to the quality of the signal on the signal line. A signal with good signal integrity means that it has the necessary voltage levels to reach when needed. Signal integrity issues are no...

AI Technical Summary

Problems solved by technology

The disadvantages are: the number of faults is large; due to the short-path effect of the gate delay test, it is difficult to find the worst-case test; the test generation algorithm requires a large change in the traditional algorithm

The disadvantages are: it is impossible to generate tests for suspected crosstalk sources in a targeted manner; genetic algorithms and SPICE (The Stanford Program on International and Cross-Cultural Education, a general-purpose circuit-level simulation program first developed by Stanford University in the United States, and later adopted by the industry The combination of universally adopted and extended) simulations introduces multiple iterations of SPICE simulations, which require a long calculation time

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